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Contents

README

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NCD57080BDR2G

onsemi · Gate Drive ICs · SOIC-8

NCD57080BDR2G from onsemi, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.

Pinout

Pin Name Type Function
1 VDD1 power_in Input-side power supply; a good quality bypass capacitor is required from this pin to GND1, placed close to the pins, and the UVLO circuit enables operation at power-on when a typical supply above VUVLO1-OUT-ON is present.
2 IN+ input Non-inverting gate driver input, internally clamped to GND1 with an equivalent 125 kΩ pull-down to keep the output low without an input signal, and a minimum positive or negative pulse width is required before OUT responds.
3 IN− input Inverting gate driver input, internally clamped to VDD1 with an equivalent 125 kΩ pull-up to keep the output low without an input signal, and a minimum positive or negative pulse width is required before OUT responds.
4 GND1 power_in Input-side ground reference.
5 VDD2 power_in Output-side positive power supply whose operating range runs from UVLO2 to its maximum allowed value; a good quality bypass capacitor is required from this pin to GND2, placed close to the pins.
6 OUT output Driver output that provides the drive voltage and source/sink current to the IGBT/MOSFET gate, rated for 6.5 A peak sourcing and 6.5 A peak sinking (pulsed), and is actively pulled low during start-up.
7 GND2 power_in Output-side gate drive reference connected to the IGBT emitter or MOSFET source (pin 7 on version B; pin 8 on versions A and C).
8 VEE2 power_in Output-side negative power supply with a good quality bypass capacitor required from this pin to GND2 placed close to the pin; VEE2-GND2 is rated from -18 V to 0.3 V.

Key specifications

Parameter Value
Manufacturer onsemi
Package SOIC-8
Category Power Management ICs
Pins 8

Electrical characteristics

Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).

Parameter Symbol Min Typ Max Unit Conditions Page
Supply Voltage, Input Side (VDD1-GND1) VDD1−GND1 -0.3 22 V 6
Positive Power Supply, Output Side (VDD2-GND2) VDD2−GND2 -0.3 32 V 6
Negative Power Supply, Output Side (VEE2-GND2) VEE2−GND2 -18 0.3 V 6
Differential Power Supply, Output Side (VMAX2), NCx5708zB VDD2−VEE2 (VMAX2) 0 36 V NCx5708zB 6
Gate-driver Output Low Voltage, NCx5708zA/B VOUT−GND2 -0.3 V NCx5708zA/B 6
Voltage at IN+, IN− VLIM−GND1 -0.3 V 6
Gate-driver Output Sourcing Current IPK−SRC 6.5 A maximum pulse width = 10 µs, maximum duty cycle = 0.2%, VDD2 = 15 V, VEE2 = 0 V 6
Gate-driver Output Sinking Current IPK−SNK 6.5 A maximum pulse width = 10 µs, maximum duty cycle = 0.2%, VDD2 = 15 V, VEE2 = 0 V 6
Power Dissipation (SOIC-8 Narrow Package) PD 1315 mW 6
Maximum Junction Temperature TJ(max) -40 150 °C 7
Storage Temperature Range TSTG -65 150 °C 7
ESD Capability, Human Body Model ESDHBM -2 2 kV AEC-Q100-002 (EIA/JESD22-A114) 7
Supply Voltage, Input Side (operating range) VDD1−GND1 20 V 7
Positive Power Supply, Output Side (operating range) VDD2−GND2 30 V 7
Negative Power Supply, Output Side (operating range), NCx5708zB VEE2−GND2 -15 0 V NCx5708zB 7
Differential Power Supply, Output Side (VMAX2) operating range, NCx5708zB VDD2−VEE2 (VMAX2) 0 32 V NCx5708zB 7
Low Level Input Voltage at IN+, IN− VIL 0 V 7
Common Mode Transient Immunity /dVISO/dt/ 100 kV/s Note 8: tested by ±1500 V pulses up to 100 kV/s 7
Ambient Temperature TA -40 125 °C 7
UVLO1 Output Enabled VUVLO1−OUT−ON 3.1 V UVLO1 Output Enabled 8
UVLO1 Output Disabled VUVLO1−OUT−OFF 2.4 V UVLO1 Output Disabled 8
UVLO1 Hysteresis VUVLO1−HYST 0.1 V 8
UVLO2 Output Enabled, NCx57080y VUVLO2−OUT−ON 12.4 12.9 13.4 V NCx57080y 8
UVLO2 Output Disabled, NCx57080y VUVLO2−OUT−OFF 11.5 12 12.5 V NCx57080y 8
UVLO2 Hysteresis VUVLO2−HYST 0.7 1 V 8
Input Supply Quiescent Current (VDD1 = 3.3 V) IDD1−0−3.3 2 mA IN+ = Low, IN− = Low, VDD1 = 3.3 V 8
Input Supply Quiescent Current (VDD1 = 5 V) IDD1−0−5 2 mA IN+ = Low, IN− = Low 8
Input Supply Quiescent Current (VDD1 = 15 V) IDD1−0−15 2 mA IN+ = Low, IN− = Low, VDD1 = 15 V 8
Input Supply Current, IN+ High IDD1−100−5 5.5 mA IN+ = High, IN− = Low 8
Output Positive Supply Quiescent Current IDD2−0 2 mA IN+ = Low, IN− = Low, no load 8
Output Positive Supply Current, IN+ High IDD2−100 2 mA IN+ = High, IN− = Low, no load 8
Output Negative Supply Quiescent Current (NCx5708zB) IEE2−0 2 mA IN+ = Low, IN− = Low, no load, VEE2 = −8 V 8
Output Negative Supply Current, IN+ High (NCx5708zB) IEE2−100 2 mA IN+ = High, IN− = Low, no load, VEE2 = −8 V 8
IN− Input Current (VDD1 = 3.3 V) IIN−L−3.3 100 µA VIN− = 0 V, VDD1 = 3.3 V 8
IN− Input Current (VDD1 = 5 V) IIN−L−5 100 µA VIN− = 0 V 8
IN− Input Current (VDD1 = 15 V) IIN−L−15 100 µA VIN− = 0 V, VDD1 = 15 V 8
IN− Input Current (VDD1 = 20 V) IIN−L−20 100 µA VIN− = 0 V, VDD1 = 20 V 8
IN+ Input Current (VDD1 = 3.3 V) IIN+H−3.3 100 µA VIN+ = VDD1 = 3.3 V 8
IN+ Input Current (VDD1 = 5 V) IIN+H−5 100 µA VIN+ = VDD1 = 5 V 8
IN+ Input Current (VDD1 = 15 V) IIN+H−15 100 µA VIN+ = VDD1 = 15 V 8
IN+ Input Current (VDD1 = 20 V) IIN+H−20 100 µA VIN+ = VDD1 = 20 V 8
Input Pulse Width for Guaranteed No Response at Output tON−MIN1 10 ns 8
Input Pulse Width for Guaranteed Response at Output tON−MIN2 40 ns 8
Output Low State VOUTL1 0.15 0.3 V ISINK = 200 mA 9
Output Low State (high sink current) VOUTL2 0.8 V ISINK = 1.0 A, TA = 25°C (Note 12) 9
Output High State VOUTH1 0.2 0.35 V ISRC = 200 mA 9
Output High State (high source current) VOUTH2 1 V ISRC = 1.0 A, TA = 25°C (Note 12) 9
Clamping Voltage, Sourcing (VOUT / VOUTH − VDD2) VCLAMP−OUTH 0.7 1.3 V IN+ = Low, IN− = High, ICLAMP−OUT/OUTH = 500 mA, (pulse test, tCLPmax = 10 µs) 9
Clamping Voltage, Sinking (VOUTL − VDD2) VCLAMP−OUTL 0.8 1.5 V IN+ = High, IN− = Low, ICLAMP−OUTL = 500 mA, (pulse test, tCLPmax = 10 µs) 9
Propagation Delay IN+, IN− to Output High (3.3 V) tPD−ON−3.3 40 60 90 ns VDD1 = VIN+ = 3.3V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output High (5 V) tPD−ON−5 40 60 90 ns VDD1 = VIN+ = 5 V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output High (15 V) tPD−ON−15 40 60 90 ns VDD1 = VIN+ = 15 V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output High (20 V) tPD−ON−20 40 60 90 ns VDD1 = VIN+ = 20 V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output Low (3.3 V) tPD−OFF−3.3 40 60 90 ns VDD1 = VIN+ = 3.3 V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output Low (5 V) tPD−OFF−5 40 60 90 ns VDD1 = VIN+ = 5 V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output Low (15 V) tPD−OFF−15 40 60 90 ns VDD1 = VIN+ = 15 V, VIN− = 0 V 9
Propagation Delay IN+, IN− to Output Low (20 V) tPD−OFF−20 40 60 90 ns VDD1 = VIN+ = 20 V, VIN− = 0 V 9
Propagation Delay Distortion (TA = −40 °C to 125 °C) tDISTORT -25 25 ns TA = −40°C to 125°C, PW > 150 ns 9
Prop Delay Distortion between Parts tDISTORT_TOT -30 0 30 ns PW > 150 ns 9
Thermal Resistance, Junction-to-Air, SOIC-8 narrow body RJA 95 °C/W 4-Layer (Note 5: 100 mm² copper, 1 oz, FR4 PCB) 7

Materials and finish

As the datasheet states them (page.json metadata.appearance; the 3D model's colours follow it).

Part Material Colour / plating Datasheet says Page
housing ABS RIO Insulation Resistance at TS, VIO = 500 V 109 Table 3. ABSOLUTE MAXIMUM RATINGS (Note 1) 6

CAD (KiCad official)

  • Symbol: NCD57080BDR2G
  • Footprint: Package_SO:SOIC-8_3.9x4.9mm_P1.27mm
  • 3D model: SOIC-8 (KiCad packages3D, STEP)
  • 3D model files: ncd57080bdr2g-etched.step / ncd57080bdr2g-etched.glb carry the MPN laser-etched on the die in a toggleable Adom.LaserEtch group (Fusion-ready); ncd57080bdr2g.step / ncd57080bdr2g.glb are the bare package body.

Provenance

Data extracted from the manufacturer datasheet, not a distributor listing:

  • Datasheet: onsemi datasheet (24 pp, sha256 748b3eca1fc6dfa7, retrieved 2026-10-30, tier: manufacturer)
  • Extractor: parts-factory 2.0.0 / extract_pins 0.3, primary claude-haiku-5-5 (text), consensus claude-sonnet-5-5 (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
  • CAD: KiCad official libraries (CC-BY-SA 4.0).

Datasheet PDF