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SCANSTA112VSX

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Texas Instruments Interface - Specialized, TQFP-100(14x14). Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.

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SCANSTA112VSX

Texas Instruments · Interface - Specialized · TQFP-100(14x14)

SCANSTA112VSX from Texas Instruments, in a TQFP-100(14x14). Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.

Pinout

Pin Name Type Function
1 S0 input Slot identification input bit 0, used to assign a unique address to this device on the backplane.
2 S1 input Slot identification input bit 1, used to assign a unique address to this device on the backplane.
3 VCC power_in Power supply, 3.0V to 3.6V.
4 S2 input Slot identification input bit 2, used to assign a unique address to this device on the backplane.
5 S3 input Slot identification input bit 3, used to assign a unique address to this device on the backplane.
6 S4 input Slot identification input bit 4, used to assign a unique address to this device on the backplane.
7 S5 input Slot identification input bit 5, used to assign a unique address to this device on the backplane.
8 GND power_in Ground.
9 S6 input Slot identification input bit 6, used to assign a unique address to this device on the backplane.
10 S7 input Slot identification input bit 7, used to assign a unique address to this device on the backplane.
11 ADDMASK input Address mask input that allows masking of lower slot input pins.
12 TRANS input Transparent mode enable input, loaded into the TRANSENABLE bit of the control register at power-up.
13 VCC power_in Power supply, 3.0V to 3.6V.
14 OE input Active-low output enable for the local scan ports; when high it TRI-STATEs all local scan ports.
15 LSPsel0 input In Stitcher Mode defines whether LSP0 is included in the scan chain.
16 LSPsel1 input In Stitcher Mode defines whether LSP1 is included in the scan chain.
17 LSPsel2 input In Stitcher Mode defines whether LSP2 is included in the scan chain.
18 GND power_in Ground.
19 LSPsel3 input In Stitcher Mode defines whether LSP3 is included in the scan chain.
20 LSPsel4 input In Stitcher Mode defines whether LSP4 is included in the scan chain.
21 LSPsel5 input In Stitcher Mode defines whether LSP5 is included in the scan chain.
22 LSPsel6 input In Stitcher Mode defines whether LSP6 is included in the scan chain.
23 VCC power_in Power supply, 3.0V to 3.6V.
24 MPselB1/B0 input Master port selection: 0 selects LSPB0 as the backplane master port, and the unselected port becomes LSP00.
25 SB/S input Selects ScanBridge or Stitcher Mode.
26 TDIB0 input Backplane test data input with 25kΩ internal pull-up and no ESD clamp diode.
27 TDOB0 bidirectional Backplane test data output, bidirectional TRI-STATE pin with 12mA drive.
28 GND power_in Ground.
29 A0B0 input Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP.
30 TCKB0 bidirectional Backplane test clock, bidirectional TRI-STATE pin with 24mA drive and hysteresis, no pull-up.
31 TRSTB0 bidirectional Active-low asynchronous test reset, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up.
32 TMSB0 bidirectional Backplane test mode select, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up.
33 VCC power_in Power supply, 3.0V to 3.6V.
34 A1B0 input Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP.
35 TRISTB0 output TRI-STATE notification output, asserted high when TDOB0 is TRI-STATEd, 12mA drive.
36 Y0B0 output Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive.
37 Y1B0 output Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive.
38 GND power_in Ground.
39 TDIB1 input Backplane test data input with 25kΩ internal pull-up and no ESD clamp diode.
40 TDOB1 bidirectional Backplane test data output, bidirectional TRI-STATE pin with 12mA drive.
41 A0B1 input Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP.
42 TCKB1 bidirectional Backplane test clock, bidirectional TRI-STATE pin with 24mA drive and hysteresis, no pull-up.
43 VCC power_in Power supply, 3.0V to 3.6V.
44 TRSTB1 bidirectional Active-low asynchronous test reset, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up.
45 TMSB1 bidirectional Backplane test mode select, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up.
46 Y1B1 output Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive.
47 TRISTB1 output TRI-STATE notification output, asserted high when TDOB1 is TRI-STATEd, 12mA drive.
48 GND power_in Ground.
49 Y0B1 output Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive.
50 A1B1 input Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP.
51 TLR_TRST input Sets driven value of TRST0-5 when LSP TAPs are in TLR; to be tied low to match the SCANSTA111.
52 TLR_TRST6 input Affects TRST of LSP6 only; to be tied low to match the SCANSTA111.
53 VCC power_in Power supply, 3.0V to 3.6V.
54 RESET input Active-low reset input that forces a device reset regardless of current state.
55 TDI01 input Test data input for local scan port 01 with 25kΩ internal pull-up.
56 TDO01 tri_state Test data output for local scan port 01, TRI-STATE with 12mA drive.
57 TMS01 tri_state Test mode select output for local scan port 01, TRI-STATE with 24mA drive, no pull-up.
58 GND power_in Ground.
59 TCK01 tri_state Local test clock output for port 01, buffered TCKB, TRI-STATE with 24mA drive.
60 TRST01 tri_state Active-low local test reset for port 01, gated TRSTB, TRI-STATE with 24mA drive.
61 TRIST01 output TRI-STATE notification output, asserted high when TDO01 is TRI-STATEd, 12mA drive.
62 Y101 output Local pass-through TRI-STATE output driven from backplane pin A, 12mA drive.
63 VCC power_in Power supply, 3.0V to 3.6V.
64 A101 input Local pass-through input with 25kΩ pull-up, can be driven to backplane pin Y.
65 Y001 output Local pass-through TRI-STATE output driven from backplane pin A, 12mA drive.
66 A001 input Local pass-through input with 25kΩ pull-up, can be driven to backplane pin Y.
67 TDI02 input Test data input for local scan port 02 with 25kΩ internal pull-up.
68 GND power_in Ground.
69 TDO02 tri_state Test data output for local scan port 02, TRI-STATE with 12mA drive.
70 TMS02 tri_state Test mode select output for local scan port 02, TRI-STATE with 24mA drive, no pull-up.
71 TCK02 tri_state Local test clock output for port 02, buffered TCKB, TRI-STATE with 24mA drive.
72 TRST02 tri_state Active-low local test reset for port 02, gated TRSTB, TRI-STATE with 24mA drive.
73 VCC power_in Power supply, 3.0V to 3.6V.
74 TRIST02 output TRI-STATE notification output, asserted high when TDO02 is TRI-STATEd, 12mA drive.
75 TDI03 input Test data input for local scan port 03 with 25kΩ internal pull-up.
76 TDO03 tri_state Test data output for local scan port 03, TRI-STATE with 12mA drive.
77 TMS03 tri_state Test mode select output for local scan port 03, TRI-STATE with 24mA drive, no pull-up.
78 GND power_in Ground.
79 TRST03 tri_state Active-low local test reset for port 03, gated TRSTB, TRI-STATE with 24mA drive.
80 TCK03 tri_state Local test clock output for port 03, buffered TCKB, TRI-STATE with 24mA drive.
81 TRIST03 output TRI-STATE notification output, asserted high when TDO03 is TRI-STATEd, 12mA drive.
82 TDI04 input Test data input for local scan port 04 with 25kΩ internal pull-up.
83 VCC power_in Power supply, 3.0V to 3.6V.
84 TDO04 tri_state Test data output for local scan port 04, TRI-STATE with 12mA drive.
85 TMS04 tri_state Test mode select output for local scan port 04, TRI-STATE with 24mA drive, no pull-up.
86 TCK04 tri_state Local test clock output for port 04, buffered TCKB, TRI-STATE with 24mA drive.
87 TRST04 tri_state Active-low local test reset for port 04, gated TRSTB, TRI-STATE with 24mA drive.
88 GND power_in Ground.
89 TMS05 tri_state Test mode select output for local scan port 05, TRI-STATE with 24mA drive, no pull-up.
90 TDO05 tri_state Test data output for local scan port 05, TRI-STATE with 12mA drive.
91 TDI05 input Test data input for local scan port 05 with 25kΩ internal pull-up.
92 TCK05 tri_state Local test clock output for port 05, buffered TCKB, TRI-STATE with 24mA drive.
93 VCC power_in Power supply, 3.0V to 3.6V.
94 TRST05 tri_state Active-low local test reset for port 05, gated TRSTB, TRI-STATE with 24mA drive.
95 TDI06 input Test data input for local scan port 06 with 25kΩ internal pull-up.
96 TDO06 tri_state Test data output for local scan port 06, TRI-STATE with 12mA drive.
97 TMS06 tri_state Test mode select output for local scan port 06, TRI-STATE with 24mA drive, no pull-up.
98 GND power_in Ground.
99 TCK06 tri_state Local test clock output for port 06, buffered TCKB, TRI-STATE with 24mA drive.
100 TRST06 tri_state Active-low local test reset for port 06, gated TRSTB, TRI-STATE with 24mA drive.

Key specifications

Parameter Value
Manufacturer Texas Instruments
Package TQFP-100(14x14)
Category Interface
Pins 100

CAD (KiCad official)

  • Symbol: SCANSTA112VSX
  • Footprint: Package_QFP:TQFP-100_14x14mm_P0.5mm
  • 3D model: TQFP-100(14x14) (KiCad packages3D, STEP)
  • 3D model files: scansta112vsx-etched.step / scansta112vsx-etched.glb carry the MPN laser-etched on the die in a toggleable Adom.LaserEtch group (Fusion-ready); scansta112vsx.step / scansta112vsx.glb are the bare package body.

Provenance

Data extracted from the manufacturer datasheet, not a distributor listing:

  • Datasheet: Texas Instruments datasheet (23 pp, sha256 a1bace26a628d459, retrieved 2026-10-08, tier: lcsc)
  • Extractor: parts-factory 2.0.0 / extract_pins 0.3, primary claude-sonnet-5-5 (text+vision), consensus claude-opus-5-5 (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
  • CAD: KiCad official libraries (CC-BY-SA 4.0).

Datasheet PDF