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SCANSTA112VSX
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Texas Instruments Interface - Specialized, TQFP-100(14x14). Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.
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README.mdadded+136@@ -0,0 +1,136 @@+# SCANSTA112VSX++**Texas Instruments** · Interface - Specialized · TQFP-100(14x14)++SCANSTA112VSX from Texas Instruments, in a TQFP-100(14x14). Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.++## Pinout++| Pin | Name | Type | Function |+|---|---|---|---|+| 1 | S0 | input | Slot identification input bit 0, used to assign a unique address to this device on the backplane. |+| 2 | S1 | input | Slot identification input bit 1, used to assign a unique address to this device on the backplane. |+| 3 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 4 | S2 | input | Slot identification input bit 2, used to assign a unique address to this device on the backplane. |+| 5 | S3 | input | Slot identification input bit 3, used to assign a unique address to this device on the backplane. |+| 6 | S4 | input | Slot identification input bit 4, used to assign a unique address to this device on the backplane. |+| 7 | S5 | input | Slot identification input bit 5, used to assign a unique address to this device on the backplane. |+| 8 | GND | power_in | Ground. |+| 9 | S6 | input | Slot identification input bit 6, used to assign a unique address to this device on the backplane. |+| 10 | S7 | input | Slot identification input bit 7, used to assign a unique address to this device on the backplane. |+| 11 | ADDMASK | input | Address mask input that allows masking of lower slot input pins. |+| 12 | TRANS | input | Transparent mode enable input, loaded into the TRANSENABLE bit of the control register at power-up. |+| 13 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 14 | OE | input | Active-low output enable for the local scan ports; when high it TRI-STATEs all local scan ports. |+| 15 | LSPsel0 | input | In Stitcher Mode defines whether LSP0 is included in the scan chain. |+| 16 | LSPsel1 | input | In Stitcher Mode defines whether LSP1 is included in the scan chain. |+| 17 | LSPsel2 | input | In Stitcher Mode defines whether LSP2 is included in the scan chain. |+| 18 | GND | power_in | Ground. |+| 19 | LSPsel3 | input | In Stitcher Mode defines whether LSP3 is included in the scan chain. |+| 20 | LSPsel4 | input | In Stitcher Mode defines whether LSP4 is included in the scan chain. |+| 21 | LSPsel5 | input | In Stitcher Mode defines whether LSP5 is included in the scan chain. |+| 22 | LSPsel6 | input | In Stitcher Mode defines whether LSP6 is included in the scan chain. |+| 23 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 24 | MPselB1/B0 | input | Master port selection: 0 selects LSPB0 as the backplane master port, and the unselected port becomes LSP00. |+| 25 | SB/S | input | Selects ScanBridge or Stitcher Mode. |+| 26 | TDIB0 | input | Backplane test data input with 25kΩ internal pull-up and no ESD clamp diode. |+| 27 | TDOB0 | bidirectional | Backplane test data output, bidirectional TRI-STATE pin with 12mA drive. |+| 28 | GND | power_in | Ground. |+| 29 | A0B0 | input | Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP. |+| 30 | TCKB0 | bidirectional | Backplane test clock, bidirectional TRI-STATE pin with 24mA drive and hysteresis, no pull-up. |+| 31 | TRSTB0 | bidirectional | Active-low asynchronous test reset, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up. |+| 32 | TMSB0 | bidirectional | Backplane test mode select, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up. |+| 33 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 34 | A1B0 | input | Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP. |+| 35 | TRISTB0 | output | TRI-STATE notification output, asserted high when TDOB0 is TRI-STATEd, 12mA drive. |+| 36 | Y0B0 | output | Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive. |+| 37 | Y1B0 | output | Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive. |+| 38 | GND | power_in | Ground. |+| 39 | TDIB1 | input | Backplane test data input with 25kΩ internal pull-up and no ESD clamp diode. |+| 40 | TDOB1 | bidirectional | Backplane test data output, bidirectional TRI-STATE pin with 12mA drive. |+| 41 | A0B1 | input | Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP. |+| 42 | TCKB1 | bidirectional | Backplane test clock, bidirectional TRI-STATE pin with 24mA drive and hysteresis, no pull-up. |+| 43 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 44 | TRSTB1 | bidirectional | Active-low asynchronous test reset, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up. |+| 45 | TMSB1 | bidirectional | Backplane test mode select, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up. |+| 46 | Y1B1 | output | Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive. |+| 47 | TRISTB1 | output | TRI-STATE notification output, asserted high when TDOB1 is TRI-STATEd, 12mA drive. |+| 48 | GND | power_in | Ground. |+| 49 | Y0B1 | output | Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive. |+| 50 | A1B1 | input | Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP. |+| 51 | TLR_TRST | input | Sets driven value of TRST0-5 when LSP TAPs are in TLR; to be tied low to match the SCANSTA111. |+| 52 | TLR_TRST6 | input | Affects TRST of LSP6 only; to be tied low to match the SCANSTA111. |+| 53 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 54 | RESET | input | Active-low reset input that forces a device reset regardless of current state. |+| 55 | TDI01 | input | Test data input for local scan port 01 with 25kΩ internal pull-up. |+| 56 | TDO01 | tri_state | Test data output for local scan port 01, TRI-STATE with 12mA drive. |+| 57 | TMS01 | tri_state | Test mode select output for local scan port 01, TRI-STATE with 24mA drive, no pull-up. |+| 58 | GND | power_in | Ground. |+| 59 | TCK01 | tri_state | Local test clock output for port 01, buffered TCKB, TRI-STATE with 24mA drive. |+| 60 | TRST01 | tri_state | Active-low local test reset for port 01, gated TRSTB, TRI-STATE with 24mA drive. |+| 61 | TRIST01 | output | TRI-STATE notification output, asserted high when TDO01 is TRI-STATEd, 12mA drive. |+| 62 | Y101 | output | Local pass-through TRI-STATE output driven from backplane pin A, 12mA drive. |+| 63 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 64 | A101 | input | Local pass-through input with 25kΩ pull-up, can be driven to backplane pin Y. |+| 65 | Y001 | output | Local pass-through TRI-STATE output driven from backplane pin A, 12mA drive. |+| 66 | A001 | input | Local pass-through input with 25kΩ pull-up, can be driven to backplane pin Y. |+| 67 | TDI02 | input | Test data input for local scan port 02 with 25kΩ internal pull-up. |+| 68 | GND | power_in | Ground. |+| 69 | TDO02 | tri_state | Test data output for local scan port 02, TRI-STATE with 12mA drive. |+| 70 | TMS02 | tri_state | Test mode select output for local scan port 02, TRI-STATE with 24mA drive, no pull-up. |+| 71 | TCK02 | tri_state | Local test clock output for port 02, buffered TCKB, TRI-STATE with 24mA drive. |+| 72 | TRST02 | tri_state | Active-low local test reset for port 02, gated TRSTB, TRI-STATE with 24mA drive. |+| 73 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 74 | TRIST02 | output | TRI-STATE notification output, asserted high when TDO02 is TRI-STATEd, 12mA drive. |+| 75 | TDI03 | input | Test data input for local scan port 03 with 25kΩ internal pull-up. |+| 76 | TDO03 | tri_state | Test data output for local scan port 03, TRI-STATE with 12mA drive. |+| 77 | TMS03 | tri_state | Test mode select output for local scan port 03, TRI-STATE with 24mA drive, no pull-up. |+| 78 | GND | power_in | Ground. |+| 79 | TRST03 | tri_state | Active-low local test reset for port 03, gated TRSTB, TRI-STATE with 24mA drive. |+| 80 | TCK03 | tri_state | Local test clock output for port 03, buffered TCKB, TRI-STATE with 24mA drive. |+| 81 | TRIST03 | output | TRI-STATE notification output, asserted high when TDO03 is TRI-STATEd, 12mA drive. |+| 82 | TDI04 | input | Test data input for local scan port 04 with 25kΩ internal pull-up. |+| 83 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 84 | TDO04 | tri_state | Test data output for local scan port 04, TRI-STATE with 12mA drive. |+| 85 | TMS04 | tri_state | Test mode select output for local scan port 04, TRI-STATE with 24mA drive, no pull-up. |+| 86 | TCK04 | tri_state | Local test clock output for port 04, buffered TCKB, TRI-STATE with 24mA drive. |+| 87 | TRST04 | tri_state | Active-low local test reset for port 04, gated TRSTB, TRI-STATE with 24mA drive. |+| 88 | GND | power_in | Ground. |+| 89 | TMS05 | tri_state | Test mode select output for local scan port 05, TRI-STATE with 24mA drive, no pull-up. |+| 90 | TDO05 | tri_state | Test data output for local scan port 05, TRI-STATE with 12mA drive. |+| 91 | TDI05 | input | Test data input for local scan port 05 with 25kΩ internal pull-up. |+| 92 | TCK05 | tri_state | Local test clock output for port 05, buffered TCKB, TRI-STATE with 24mA drive. |+| 93 | VCC | power_in | Power supply, 3.0V to 3.6V. |+| 94 | TRST05 | tri_state | Active-low local test reset for port 05, gated TRSTB, TRI-STATE with 24mA drive. |+| 95 | TDI06 | input | Test data input for local scan port 06 with 25kΩ internal pull-up. |+| 96 | TDO06 | tri_state | Test data output for local scan port 06, TRI-STATE with 12mA drive. |+| 97 | TMS06 | tri_state | Test mode select output for local scan port 06, TRI-STATE with 24mA drive, no pull-up. |+| 98 | GND | power_in | Ground. |+| 99 | TCK06 | tri_state | Local test clock output for port 06, buffered TCKB, TRI-STATE with 24mA drive. |+| 100 | TRST06 | tri_state | Active-low local test reset for port 06, gated TRSTB, TRI-STATE with 24mA drive. |++## Key specifications++| Parameter | Value |+|---|---|+| Manufacturer | Texas Instruments |+| Package | TQFP-100(14x14) |+| Category | Interface |+| Pins | 100 |++## CAD (KiCad official)++- Symbol: `SCANSTA112VSX`+- Footprint: `Package_QFP:TQFP-100_14x14mm_P0.5mm`+- 3D model: TQFP-100(14x14) (KiCad packages3D, STEP)+- 3D model files: `scansta112vsx-etched.step` / `scansta112vsx-etched.glb` carry the MPN laser-etched on the die in a toggleable `Adom.LaserEtch` group (Fusion-ready); `scansta112vsx.step` / `scansta112vsx.glb` are the bare package body.++## Provenance++Data extracted from the manufacturer datasheet, not a distributor listing:++- **Datasheet:** [Texas Instruments datasheet](https://www.ti.com/cn/lit/gpn/scansta112) (23 pp, sha256 `a1bace26a628d459`, retrieved 2026-10-08, tier: lcsc)+- **Extractor:** parts-factory `2.0.0` / `extract_pins 0.3`, primary `claude-sonnet-5-5` (text+vision), consensus `claude-opus-5-5` (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.+- **CAD:** KiCad official libraries (CC-BY-SA 4.0).++[Datasheet PDF](docs/scansta112vsx-datasheet.pdf)
page.jsonadded+754@@ -0,0 +1,754 @@+{+ "slug": "scansta112vsx",+ "version": "0.1.0",+ "type": "component",+ "description": "Texas Instruments Interface - Specialized, TQFP-100(14x14). Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.",+ "tags": [+ "component",+ "interface",+ "scansta112vsx",+ "factory-2.0.0",+ "extractor-text"+ ],+ "dependencies": {},+ "hero": {+ "type": "image",+ "path": "docs/hero.png"+ },+ "files": [+ "page.json",+ "README.md",+ "scansta112vsx.kicad_sym",+ "scansta112vsx.kicad_mod",+ "scansta112vsx.glb",+ "scansta112vsx.step",+ "scansta112vsx.lbr",+ "docs/hero.png",+ "docs/scansta112vsx-datasheet.pdf",+ "viewers/symbol.html",+ "viewers/footprint.html",+ "scansta112vsx-hero.glb",+ "scansta112vsx-hero.overlay.json"+ ],+ "component": {+ "mpn": "SCANSTA112VSX",+ "manufacturer": "Texas Instruments",+ "package": "TQFP-100(14x14)",+ "pin_count": 100,+ "category": "Interface",+ "subcategory": "Interface - Specialized",+ "datasheet": "https://www.ti.com/cn/lit/gpn/scansta112",+ "parts": {+ "symbol": "scansta112vsx.kicad_sym",+ "footprint": "scansta112vsx.kicad_mod",+ "model_3d": "scansta112vsx-hero.glb",+ "model_3d_plain": "scansta112vsx.glb",+ "model_3d_step": "scansta112vsx-etched.step",+ "model_3d_step_plain": "scansta112vsx.step",+ "lbr": "scansta112vsx.lbr"+ },+ "distributor_links": {+ "lcsc": "C2870047",+ "digikey": "SCANSTA112VSX-ND",+ "mouser": "926-SCANSTA112VSX"+ },+ "distributor_check": {+ "checked_at": "2026-10-08T16:56:09Z",+ "source": "Component Ocean /api/assign-pns",+ "digikey": {+ "pn": "SCANSTA112VSX-ND",+ "status": "found",+ "lifecycle": "Obsolete"+ },+ "mouser": {+ "pn": "926-SCANSTA112VSX",+ "status": "found",+ "lifecycle": "Obsolete"+ }+ },+ "pins": [+ {+ "number": "1",+ "name": "S0",+ "type": "input",+ "description": "Slot identification input bit 0, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "2",+ "name": "S1",+ "type": "input",+ "description": "Slot identification input bit 1, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "3",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "4",+ "name": "S2",+ "type": "input",+ "description": "Slot identification input bit 2, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "5",+ "name": "S3",+ "type": "input",+ "description": "Slot identification input bit 3, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "6",+ "name": "S4",+ "type": "input",+ "description": "Slot identification input bit 4, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "7",+ "name": "S5",+ "type": "input",+ "description": "Slot identification input bit 5, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "8",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "9",+ "name": "S6",+ "type": "input",+ "description": "Slot identification input bit 6, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "10",+ "name": "S7",+ "type": "input",+ "description": "Slot identification input bit 7, used to assign a unique address to this device on the backplane."+ },+ {+ "number": "11",+ "name": "ADDMASK",+ "type": "input",+ "description": "Address mask input that allows masking of lower slot input pins."+ },+ {+ "number": "12",+ "name": "TRANS",+ "type": "input",+ "description": "Transparent mode enable input, loaded into the TRANSENABLE bit of the control register at power-up."+ },+ {+ "number": "13",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "14",+ "name": "OE",+ "type": "input",+ "description": "Active-low output enable for the local scan ports; when high it TRI-STATEs all local scan ports."+ },+ {+ "number": "15",+ "name": "LSPsel0",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP0 is included in the scan chain."+ },+ {+ "number": "16",+ "name": "LSPsel1",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP1 is included in the scan chain."+ },+ {+ "number": "17",+ "name": "LSPsel2",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP2 is included in the scan chain."+ },+ {+ "number": "18",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "19",+ "name": "LSPsel3",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP3 is included in the scan chain."+ },+ {+ "number": "20",+ "name": "LSPsel4",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP4 is included in the scan chain."+ },+ {+ "number": "21",+ "name": "LSPsel5",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP5 is included in the scan chain."+ },+ {+ "number": "22",+ "name": "LSPsel6",+ "type": "input",+ "description": "In Stitcher Mode defines whether LSP6 is included in the scan chain."+ },+ {+ "number": "23",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "24",+ "name": "MPselB1/B0",+ "type": "input",+ "description": "Master port selection: 0 selects LSPB0 as the backplane master port, and the unselected port becomes LSP00."+ },+ {+ "number": "25",+ "name": "SB/S",+ "type": "input",+ "description": "Selects ScanBridge or Stitcher Mode."+ },+ {+ "number": "26",+ "name": "TDIB0",+ "type": "input",+ "description": "Backplane test data input with 25kΩ internal pull-up and no ESD clamp diode."+ },+ {+ "number": "27",+ "name": "TDOB0",+ "type": "bidirectional",+ "description": "Backplane test data output, bidirectional TRI-STATE pin with 12mA drive."+ },+ {+ "number": "28",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "29",+ "name": "A0B0",+ "type": "input",+ "description": "Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP."+ },+ {+ "number": "30",+ "name": "TCKB0",+ "type": "bidirectional",+ "description": "Backplane test clock, bidirectional TRI-STATE pin with 24mA drive and hysteresis, no pull-up."+ },+ {+ "number": "31",+ "name": "TRSTB0",+ "type": "bidirectional",+ "description": "Active-low asynchronous test reset, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up."+ },+ {+ "number": "32",+ "name": "TMSB0",+ "type": "bidirectional",+ "description": "Backplane test mode select, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up."+ },+ {+ "number": "33",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "34",+ "name": "A1B0",+ "type": "input",+ "description": "Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP."+ },+ {+ "number": "35",+ "name": "TRISTB0",+ "type": "output",+ "description": "TRI-STATE notification output, asserted high when TDOB0 is TRI-STATEd, 12mA drive."+ },+ {+ "number": "36",+ "name": "Y0B0",+ "type": "output",+ "description": "Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive."+ },+ {+ "number": "37",+ "name": "Y1B0",+ "type": "output",+ "description": "Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive."+ },+ {+ "number": "38",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "39",+ "name": "TDIB1",+ "type": "input",+ "description": "Backplane test data input with 25kΩ internal pull-up and no ESD clamp diode."+ },+ {+ "number": "40",+ "name": "TDOB1",+ "type": "bidirectional",+ "description": "Backplane test data output, bidirectional TRI-STATE pin with 12mA drive."+ },+ {+ "number": "41",+ "name": "A0B1",+ "type": "input",+ "description": "Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP."+ },+ {+ "number": "42",+ "name": "TCKB1",+ "type": "bidirectional",+ "description": "Backplane test clock, bidirectional TRI-STATE pin with 24mA drive and hysteresis, no pull-up."+ },+ {+ "number": "43",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "44",+ "name": "TRSTB1",+ "type": "bidirectional",+ "description": "Active-low asynchronous test reset, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up."+ },+ {+ "number": "45",+ "name": "TMSB1",+ "type": "bidirectional",+ "description": "Backplane test mode select, bidirectional TRI-STATE pin with 24mA drive and 25kΩ pull-up."+ },+ {+ "number": "46",+ "name": "Y1B1",+ "type": "output",+ "description": "Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive."+ },+ {+ "number": "47",+ "name": "TRISTB1",+ "type": "output",+ "description": "TRI-STATE notification output, asserted high when TDOB1 is TRI-STATEd, 12mA drive."+ },+ {+ "number": "48",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "49",+ "name": "Y0B1",+ "type": "output",+ "description": "Backplane pass-through TRI-STATE output driven from A of a single selected LSP, 12mA drive."+ },+ {+ "number": "50",+ "name": "A1B1",+ "type": "input",+ "description": "Backplane pass-through input with 25kΩ internal pull-up, driven to Y of a single selected LSP."+ },+ {+ "number": "51",+ "name": "TLR_TRST",+ "type": "input",+ "description": "Sets driven value of TRST0-5 when LSP TAPs are in TLR; to be tied low to match the SCANSTA111."+ },+ {+ "number": "52",+ "name": "TLR_TRST6",+ "type": "input",+ "description": "Affects TRST of LSP6 only; to be tied low to match the SCANSTA111."+ },+ {+ "number": "53",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "54",+ "name": "RESET",+ "type": "input",+ "description": "Active-low reset input that forces a device reset regardless of current state."+ },+ {+ "number": "55",+ "name": "TDI01",+ "type": "input",+ "description": "Test data input for local scan port 01 with 25kΩ internal pull-up."+ },+ {+ "number": "56",+ "name": "TDO01",+ "type": "tri_state",+ "description": "Test data output for local scan port 01, TRI-STATE with 12mA drive."+ },+ {+ "number": "57",+ "name": "TMS01",+ "type": "tri_state",+ "description": "Test mode select output for local scan port 01, TRI-STATE with 24mA drive, no pull-up."+ },+ {+ "number": "58",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "59",+ "name": "TCK01",+ "type": "tri_state",+ "description": "Local test clock output for port 01, buffered TCKB, TRI-STATE with 24mA drive."+ },+ {+ "number": "60",+ "name": "TRST01",+ "type": "tri_state",+ "description": "Active-low local test reset for port 01, gated TRSTB, TRI-STATE with 24mA drive."+ },+ {+ "number": "61",+ "name": "TRIST01",+ "type": "output",+ "description": "TRI-STATE notification output, asserted high when TDO01 is TRI-STATEd, 12mA drive."+ },+ {+ "number": "62",+ "name": "Y101",+ "type": "output",+ "description": "Local pass-through TRI-STATE output driven from backplane pin A, 12mA drive."+ },+ {+ "number": "63",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "64",+ "name": "A101",+ "type": "input",+ "description": "Local pass-through input with 25kΩ pull-up, can be driven to backplane pin Y."+ },+ {+ "number": "65",+ "name": "Y001",+ "type": "output",+ "description": "Local pass-through TRI-STATE output driven from backplane pin A, 12mA drive."+ },+ {+ "number": "66",+ "name": "A001",+ "type": "input",+ "description": "Local pass-through input with 25kΩ pull-up, can be driven to backplane pin Y."+ },+ {+ "number": "67",+ "name": "TDI02",+ "type": "input",+ "description": "Test data input for local scan port 02 with 25kΩ internal pull-up."+ },+ {+ "number": "68",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "69",+ "name": "TDO02",+ "type": "tri_state",+ "description": "Test data output for local scan port 02, TRI-STATE with 12mA drive."+ },+ {+ "number": "70",+ "name": "TMS02",+ "type": "tri_state",+ "description": "Test mode select output for local scan port 02, TRI-STATE with 24mA drive, no pull-up."+ },+ {+ "number": "71",+ "name": "TCK02",+ "type": "tri_state",+ "description": "Local test clock output for port 02, buffered TCKB, TRI-STATE with 24mA drive."+ },+ {+ "number": "72",+ "name": "TRST02",+ "type": "tri_state",+ "description": "Active-low local test reset for port 02, gated TRSTB, TRI-STATE with 24mA drive."+ },+ {+ "number": "73",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "74",+ "name": "TRIST02",+ "type": "output",+ "description": "TRI-STATE notification output, asserted high when TDO02 is TRI-STATEd, 12mA drive."+ },+ {+ "number": "75",+ "name": "TDI03",+ "type": "input",+ "description": "Test data input for local scan port 03 with 25kΩ internal pull-up."+ },+ {+ "number": "76",+ "name": "TDO03",+ "type": "tri_state",+ "description": "Test data output for local scan port 03, TRI-STATE with 12mA drive."+ },+ {+ "number": "77",+ "name": "TMS03",+ "type": "tri_state",+ "description": "Test mode select output for local scan port 03, TRI-STATE with 24mA drive, no pull-up."+ },+ {+ "number": "78",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "79",+ "name": "TRST03",+ "type": "tri_state",+ "description": "Active-low local test reset for port 03, gated TRSTB, TRI-STATE with 24mA drive."+ },+ {+ "number": "80",+ "name": "TCK03",+ "type": "tri_state",+ "description": "Local test clock output for port 03, buffered TCKB, TRI-STATE with 24mA drive."+ },+ {+ "number": "81",+ "name": "TRIST03",+ "type": "output",+ "description": "TRI-STATE notification output, asserted high when TDO03 is TRI-STATEd, 12mA drive."+ },+ {+ "number": "82",+ "name": "TDI04",+ "type": "input",+ "description": "Test data input for local scan port 04 with 25kΩ internal pull-up."+ },+ {+ "number": "83",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "84",+ "name": "TDO04",+ "type": "tri_state",+ "description": "Test data output for local scan port 04, TRI-STATE with 12mA drive."+ },+ {+ "number": "85",+ "name": "TMS04",+ "type": "tri_state",+ "description": "Test mode select output for local scan port 04, TRI-STATE with 24mA drive, no pull-up."+ },+ {+ "number": "86",+ "name": "TCK04",+ "type": "tri_state",+ "description": "Local test clock output for port 04, buffered TCKB, TRI-STATE with 24mA drive."+ },+ {+ "number": "87",+ "name": "TRST04",+ "type": "tri_state",+ "description": "Active-low local test reset for port 04, gated TRSTB, TRI-STATE with 24mA drive."+ },+ {+ "number": "88",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "89",+ "name": "TMS05",+ "type": "tri_state",+ "description": "Test mode select output for local scan port 05, TRI-STATE with 24mA drive, no pull-up."+ },+ {+ "number": "90",+ "name": "TDO05",+ "type": "tri_state",+ "description": "Test data output for local scan port 05, TRI-STATE with 12mA drive."+ },+ {+ "number": "91",+ "name": "TDI05",+ "type": "input",+ "description": "Test data input for local scan port 05 with 25kΩ internal pull-up."+ },+ {+ "number": "92",+ "name": "TCK05",+ "type": "tri_state",+ "description": "Local test clock output for port 05, buffered TCKB, TRI-STATE with 24mA drive."+ },+ {+ "number": "93",+ "name": "VCC",+ "type": "power_in",+ "description": "Power supply, 3.0V to 3.6V."+ },+ {+ "number": "94",+ "name": "TRST05",+ "type": "tri_state",+ "description": "Active-low local test reset for port 05, gated TRSTB, TRI-STATE with 24mA drive."+ },+ {+ "number": "95",+ "name": "TDI06",+ "type": "input",+ "description": "Test data input for local scan port 06 with 25kΩ internal pull-up."+ },+ {+ "number": "96",+ "name": "TDO06",+ "type": "tri_state",+ "description": "Test data output for local scan port 06, TRI-STATE with 12mA drive."+ },+ {+ "number": "97",+ "name": "TMS06",+ "type": "tri_state",+ "description": "Test mode select output for local scan port 06, TRI-STATE with 24mA drive, no pull-up."+ },+ {+ "number": "98",+ "name": "GND",+ "type": "power_in",+ "description": "Ground."+ },+ {+ "number": "99",+ "name": "TCK06",+ "type": "tri_state",+ "description": "Local test clock output for port 06, buffered TCKB, TRI-STATE with 24mA drive."+ },+ {+ "number": "100",+ "name": "TRST06",+ "type": "tri_state",+ "description": "Active-low local test reset for port 06, gated TRSTB, TRI-STATE with 24mA drive."+ }+ ],+ "provenance": {+ "extractor": "extract_pins 0.3",+ "factory_chain": {+ "factory": "2.0.0",+ "extractor": "extract_pins 0.3",+ "primary_model": "claude-sonnet-5-5",+ "primary_mode": "text+vision",+ "consensus_model": "claude-opus-5-5",+ "consensus": "agreed",+ "guards": "pin_guards 0.1: passed",+ "guard_notes": [+ "extractor flagged: MPN SCANSTA112VSX is not listed verbatim in the package addendum. The closest orderable, SCANSTA112V; The datasheet text calls TDIB0/TDIB1 inputs and TDOB/TCKB/TMSB/TRSTB I/O. Pin types follow the pin d",+ "vision extraction: provenance cannot be text-verified; needs consensus"+ ],+ "pages_sent": 23,+ "cost_usd": 0.7283,+ "at": "2026-10-08T16:55:36"+ },+ "datasheet": {+ "url": "https://www.ti.com/cn/lit/gpn/scansta112",+ "pages": 23,+ "sha256": "a1bace26a628d459",+ "source_tier": "lcsc"+ },+ "cad": "KiCad official (CC-BY-SA 4.0)",+ "pins": {+ "total": 100,+ "described": 100,+ "cites_pages": true,+ "refuses_to_fabricate": true+ }+ },+ "viewers": {+ "symbol": "viewers/symbol.html",+ "footprint": "viewers/footprint.html"+ },+ "models_3d": [+ {+ "file": "scansta112vsx.step",+ "role": "plain",+ "up": "Z",+ "units": "mm",+ "origin": "footprint origin = pad-pattern centre",+ "seat": "z = 0",+ "extents_mm": [+ 16,+ 16,+ 1.1+ ],+ "zmin_mm": 0,+ "centre_offset_mm": 0,+ "footprint_binding": "identity",+ "sha256": "99d530be126138ea024746562f1110203db0273456e99932e7e1930dc9f5fba5",+ "checked": "2026-10-08",+ "checked_by": "factory/step_pose.py (Z-up, origin, seat, binding)"+ },+ {+ "file": "scansta112vsx-etched.step",+ "role": "eda",+ "up": "Z",+ "units": "mm",+ "origin": "footprint origin = pad-pattern centre",+ "seat": "z = 0",+ "extents_mm": [+ 16,+ 16,+ 1.1+ ],+ "zmin_mm": 0,+ "centre_offset_mm": 0,+ "footprint_binding": "identity",+ "sha256": "b19e6a0e19e8142963f7f1053ef032c8d606d646603e7c37f22986948fcf8737",+ "checked": "2026-10-08",+ "checked_by": "factory/step_pose.py (Z-up, origin, seat, binding)"+ }+ ]+ },+ "visibility": "public",+ "org": "adom",+ "author": {+ "name": "Ray",+ "email": "[email protected]"+ }+}