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DS90UR124QVSX

Texas Instruments · LVDS ICs · TQFP-64(10x10)

DS90UR124QVSX from Texas Instruments, in a TQFP-64(10x10). Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.

Pinout

Pin Name Type Function
1 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
2 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
3 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
4 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
5 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
6 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
7 ROUT[23] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
8 ROUT[22] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
9 ROUT[21] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
10 ROUT[20] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
11 VDD power_in Digital voltage supply for the LVCMOS outputs, 3.0V to 3.6V (3.3V nominal).
12 VSS power_in Digital ground for the LVCMOS outputs.
13 ROUT[19] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
14 ROUT[18] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
15 ROUT[17] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
16 ROUT[16] output LVCMOS receiver parallel data output, Group 3 (ROUT[23:16]); tri-stated when LOCK is low.
17 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
18 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
19 ROUT[15] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
20 ROUT[14] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
21 ROUT[13] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
22 ROUT[12] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
23 LOCK output Receiver PLL status: H = PLL locked; L = unlocked, with ROUT[23:0] and RCLK tri-stated.
24 RCLK output LVCMOS parallel interface clock output; strobe edge set by the RRFB pin.
25 VSS power_in Digital ground for the LVCMOS outputs.
26 VDD power_in Digital voltage supply for the LVCMOS outputs, 3.0V to 3.6V (3.3V nominal).
27 ROUT[11] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
28 ROUT[10] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
29 ROUT[9] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
30 ROUT[8] output LVCMOS receiver parallel data output, Group 2 (ROUT[15:8]); tri-stated when LOCK is low.
31 VSS power_in Digital ground for the logic.
32 VDD power_in Digital voltage supply for the logic, 3.0V to 3.6V (3.3V nominal).
33 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
34 RES0 unconnected No connection, not physically connected to the die; leave open or tie LOW.
35 ROUT[7] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
36 ROUT[6] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
37 ROUT[5] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
38 ROUT[4] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
39 VSS power_in Digital ground for the LVCMOS outputs.
40 VDD power_in Digital voltage supply for the LVCMOS outputs, 3.0V to 3.6V (3.3V nominal).
41 ROUT[3] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
42 ROUT[2] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
43 ROUT[1] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
44 ROUT[0] output LVCMOS receiver parallel data output, Group 1 (ROUT[7:0]); also carries the BIST error count when BISTM = H.
45 PASS output @Speed BIST pass flag: L = BIST failure; H = 1x10-9 error rate achieved across the link (LOCK must be H before BIST is enabled).
46 VDD power_in Digital voltage supply for the logic, 3.0V to 3.6V (3.3V nominal).
47 VSS power_in Digital ground for the logic.
48 RPWDNB input Receiver power down bar: H = receiver enabled; L = power-down, with ROUT[23:0], RCLK and LOCK tri-stated and the PLL shut down.
49 PTOSEL input Progressive Turn On selection: H = ROUT in three groups of eight, about ±1 UI to ±2 UI apart relative to RCLK; L = PTO spread mode.
50 RES0 input Reserved; this pin must be tied LOW.
51 VDD power_in Analog LVDS voltage supply, 3.0V to 3.6V (3.3V nominal).
52 VSS power_in Analog LVDS ground.
53 RIN+ input Receiver LVDS true (+) input; terminate with 100Ω across RIN+/RIN- and AC-couple with a 100nF capacitor.
54 RIN- input Receiver LVDS inverted (-) input; terminate with 100Ω across RIN+/RIN- and AC-couple with a 100nF capacitor.
55 RRFB input Receiver clock edge select: H = ROUT strobed on the rising RCLK edge; L = falling edge.
56 VSS power_in Analog ground for the PLL VCO.
57 VDD power_in Analog voltage supply for the PLL VCO, 3.0V to 3.6V (3.3V nominal).
58 VSS power_in Analog ground for the PLL.
59 VDD power_in Analog voltage supply for the PLL, 3.0V to 3.6V (3.3V nominal).
60 REN input Receiver data enable: H = ROUT[23:0] and RCLK enabled; L = they are disabled (tri-state) while the PLL stays locked.
61 BISTEN input BIST mode enable: L = normal mode (default); H = BIST mode active, with status on the PASS pin.
62 BISTM input BIST mode select: L = per-bit error status on ROUT (default); H = accumulated error count (up to 255) on ROUT[7:0].
63 RAOFF input Randomizer control: H = backwards compatible mode for use with the DS90C241 serializer; L = additional randomization ON (default).
64 SLEW input LVCMOS output slew rate control: L = low drive output at 2mA (default); H = high drive output at 4mA.

Key specifications

Parameter Value
Manufacturer Texas Instruments
Package TQFP-64(10x10)
Category Interface
Pins 64

Electrical characteristics

Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).

Parameter Symbol Min Typ Max Unit Conditions Page
Supply Voltage (VDD) VDD 3 3.3 3.6 V 8
Operating Free Air Temperature (TA) TA -40 25 105 °C 8
Clock Rate 5 43 MHz 8
Supply Noise -100 100 mVP-P 8
Supply Voltage (VDD) VDD -0.3 4 V 7
LVCMOS Input Voltage -0.3 V 7
LVCMOS Output Voltage -0.3 V 7
LVDS Receiver Input Voltage -0.3 3.9 V 7
Junction Temperature 150 °C 7
Lead Temperature (Soldering) 260 °C soldering, 4 seconds 7
Storage Temperature Tstg -65 150 °C 7
High-Level Input Voltage VIH 2 V Rx: RPWDNB, RRFB, REN, PTOSEL, BISTEN, BISTM, SLEW, RES0 8
Low-Level Input Voltage VIL 0.8 V 8
Input Clamp Voltage VCL -1.5 -0.8 V ICL = −18mA 8
Input Current IIN -10 2 10 µA VIN = 0V or 3.6V; Rx: RRFB, REN, PTOSEL, BISTEN, BISTM, SLEW, RES0 8
Input Current (RPWDNB) IIN -20 5 20 µA VIN = 0V or 3.6V; Rx: RPWDNB 8
High-Level Output Voltage VOH 2.3 3 V IOH = −2mA, SLEW = L; IOH = −4mA, SLEW = H; Rx: ROUT[0:23], RCLK, LOCK, PASS 8
Low-Level Output Voltage VOL 0.33 0.5 V IOL = 2mA, SLEW = L; IOL = 4mA, SLEW = H 8
Output Short Circuit Current IOS -110 -70 -40 mA VOUT = 0V 8
Tri-state Output Current IOZ -30 0.4 30 µA RPWDNB, REN = 0V, VOUT = 0V or VDD; Rx: ROUT[0:23], RCLK, LOCK, PASS 8
Differential Threshold High Voltage VTH 50 mV VCM = 1.8V; Rx: RIN+, RIN− 8
Differential Threshold Low Voltage VTL -50 mV 8
Input Current (LVDS) IIN 100 250 µA VIN = 2.4V, VDD = 3.6V 8
Deserializer Total Supply Current (checkerboard) IDDR 85 105 mA CL = 4pF, SLEW = H, f = 43MHz, checkerboard pattern, LVCMOS Output 9
Deserializer Total Supply Current (random) IDDR 80 100 mA CL = 4pF, SLEW = H, f = 43MHz, random pattern, LVCMOS Output 9
Deserializer Supply Current Power-down IDDRZ 50 µA RPWDNB = 0V (All other LVCMOS Inputs = 0V, RIN+/RIN- = 0V) 9
Receiver out Clock Period tRCP 23.25 200 ns tRCP = tTCP, PTOSEL = H 10
RCLK Duty Cycle tRDC 45 50 55 % PTOSEL = H, SLEW = L 10
LVCMOS Low-to-High Transition Time tCLH 1.5 2.5 ns CL = 4pF (lumped load), SLEW = H; ROUT [0:23], RCLK, LOCK 10
LVCMOS High-to-Low Transition Time tCHL 1.5 2.5 ns CL = 4pF (lumped load), SLEW = H; ROUT [0:23], RCLK, LOCK 10
LVCMOS Low-to-High Transition Time tCLH 2 3.5 ns CL = 4pF (lumped load), SLEW = L; ROUT [0:23], RCLK, LOCK 10
LVCMOS High-to-Low Transition Time tCHL 2 3.5 ns CL = 4pF (lumped load), SLEW = L; ROUT [0:23], RCLK, LOCK 10
HIGH to Tri-state Delay tHZR 3 10 ns PTOSEL = H 11
LOW to Tri-state Delay tLZR 3 10 ns 11
Tri-state to HIGH Delay tZHR 3 10 ns 11
Tri-state to LOW Delay tZLR 3 10 ns 11
Receiver Input Tolerance Left RxIN_TOL-L 0.25 UI 5MHz-43MHz; See Figure 5-17 11
Receiver Input Tolerance Right RxIN_TOL-R 0.25 UI 5MHz-43MHz; See Figure 5-17 11
Thermal Resistance Junction-to-Ambient (4-layer, derating) RθJA 42.8 °C/W DS90UR124 64L TQFP, 4-layer board; derating 1/RθJA above +25°C 7
Thermal Resistance Junction-to-Ambient (2-layer, derating) RθJA 67.2 °C/W DS90UR124 64L TQFP, 2-layer board; derating 1/RθJA above +25°C 7
Thermal Resistance Junction-to-Case (derating) RθJC 14.6 °C/W DS90UR124 64L TQFP 7
Thermal Resistance Junction-to-Ambient RθJA 58.1 °C/W PAG [TQFP] 64 pins 8
Thermal Resistance Junction-to-Case (top) RθJC(top) 13 °C/W PAG [TQFP] 64 pins 8
Thermal Resistance Junction-to-Board RθJB 30.4 °C/W PAG [TQFP] 64 pins 8

CAD (KiCad official)

  • Symbol: DS90UR124QVSX
  • Footprint: Package_QFP:TQFP-64_10x10mm_P0.5mm
  • 3D model: TQFP-64(10x10) (KiCad packages3D, STEP)
  • 3D model files: ds90ur124qvsx-etched.step / ds90ur124qvsx-etched.glb carry the MPN laser-etched on the die in a toggleable Adom.LaserEtch group (Fusion-ready); ds90ur124qvsx.step / ds90ur124qvsx.glb are the bare package body.

Provenance

Data extracted from the manufacturer datasheet, not a distributor listing:

  • Datasheet: Texas Instruments datasheet (45 pp, sha256 fbb642ca8b1cda5a, retrieved 2026-11-11, tier: manufacturer)
  • Extractor: parts-factory 2.0.0 / extract_pins 0.3, primary claude-haiku-5-5 (text), consensus claude-sonnet-5-5 (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
  • CAD: KiCad official libraries (CC-BY-SA 4.0).

Datasheet PDF