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ADM1485ARZ-REEL7

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Analog Devices RS-485 / RS-422 ICs, SOIC-8. Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.

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ADM1485ARZ-REEL7

Analog Devices · RS-485 / RS-422 ICs · SOIC-8

ADM1485ARZ-REEL7 from Analog Devices, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.

Pinout

Pin Name Type Function
1 RO output Receiver output: driven High when A is at least 200 mV more positive than B, and Low when A is at least 200 mV more negative than B, only when the receiver is enabled.
2 RE input Receiver output enable: a low level enables the receiver output RO, and a high level places RO in a high-impedance state.
3 DE input Driver output enable: a high level enables the driver differential outputs A and B, and a low level places them in a high-impedance state.
4 DI input Driver input: when the driver is enabled, a logic low forces A low and B high, and a logic high forces A high and B low.
5 GND power_in Ground connection, 0 V.
6 A bidirectional Noninverting receiver input A and driver output A; the bus common-mode range is -7 V to +12 V.
7 B bidirectional Inverting receiver input B and driver output B; the bus common-mode range is -7 V to +12 V.
8 VCC power_in Power supply, 5 V ± 5%.

Key specifications

Parameter Value
Manufacturer Analog Devices
Package SOIC-8
Category Interface
Pins 8

Electrical characteristics

Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).

Parameter Symbol Min Typ Max Unit Conditions Page
Differential Output Voltage, no load (R = infinity) VOD 5 V R = ∞, Test Circuit 1 2
Differential Output Voltage (RS-422, VCC = 5 V) VOD 2 5 V VCC = 5 V, R = 50 Ω (RS-422), Test Circuit 1 2
Differential Output Voltage (RS-485) VOD 1.5 5 V R = 27 Ω (RS-485), Test Circuit 1 2
Differential Output Voltage with common-mode test voltage VOD3 1.5 5 V VTST = -7 V to +12 V, Test Circuit 2 2
Δ/VOD/ for Complementary Output States Δ/VOD/ 0.2 V R = 27 Ω or 50 Ω, Test Circuit 1 2
Common-Mode Output Voltage VOC 3 V R = 27 Ω or 50 Ω, Test Circuit 1 2
Δ/VOD/ for Complementary Output States (common-mode) Δ/VOD/ 0.2 V R = 27 Ω or 50 Ω 2
Output Short-Circuit Current (VOUT = High) 35 250 mA -7 V ≤ VO ≤ +12 V 2
Output Short-Circuit Current (VOUT = Low) 35 250 mA -7 V ≤ VO ≤ +12 V 2
CMOS Input Logic Threshold Low (driver) VINL 0.8 V 2
CMOS Input Logic Threshold High (driver) VINH 2 V 2
Logic Input Current (DE, DI) -1 1 μA 2
Differential Input Threshold Voltage VTH -0.2 0.2 V -7 V ≤ VCM ≤ +12 V 2
Input Resistance 12 kΩ -7 V ≤ VCM ≤ +12 V 2
Input Current (A, B) at VIN = +12 V 1 mA VIN = +12 V 2
Input Current (A, B) at VIN = -7 V -0.8 mA VIN = -7 V 2
CMOS Input Logic Threshold Low (receiver enable) VINL 0.8 V 2
CMOS Input Logic Threshold High (receiver enable) VINH 2 V 2
Logic Enable Input Current (RE) -1 1 μA 2
CMOS Output Voltage Low VOL 0.4 V IOUT = +4.0 mA 2
CMOS Output Voltage High VOH 4 V IOUT = -4.0 mA 2
Short-Circuit Output Current 7 85 mA VOUT = GND or VCC 2
Three-State Output Leakage Current -1 1 μA 0.4 V ≤ VOUT ≤ 2.4 V 2
Propagation Delay Input to Output (driver) tPLH, tPHL 2 10 15 ns RLDIFF = 54 Ω, CL1 = CL2 = 100 pF, Test Circuit 3 2
Driver O/P to O/P Skew tSKEW 1 5 ns RLDIFF = 54 Ω, CL1 = CL2 = 100 pF, Test Circuit 3 2
Driver Rise/Fall Time tR, tF 8 15 ns RLDIFF = 54 Ω, CL1 = CL2 = 100 pF, Test Circuit 3 2
Driver Enable to Output Valid 10 25 ns RL = 110 Ω, CL = 50 pF, Test Circuit 4 2
Driver Disable Timing 10 25 ns RL = 110 Ω, CL = 50 pF, Test Circuit 4 2
Matched Enable Switching /tAZH -tBZL/, /tBZH -tAZL/ 0 2 ns RL = 110 Ω, CL = 50 pF, Test Circuit 4* 2
Matched Disable Switching /tAHZ -tBLZ/, /tBHZ -tALZ/ 0 2 ns RL = 110 Ω, CL = 50 pF, Test Circuit 4* 2
Propagation Delay Input to Output (receiver) tPLH, tPHL 8 15 30 ns CL = 15 pF, Test Circuit 5 2
Receiver Skew /tPLH -tPHL/ 5 ns CL = 15 pF, Test Circuit 5 2
Receiver Enable tEN1 5 20 ns CL = 15 pF, RL = 1 kΩ, Test Circuit 6 2
Receiver Disable tEN2 5 20 ns CL = 15 pF, RL = 1 kΩ, Test Circuit 6 2
Tx Pulse Width Distortion 1 ns 2
Rx Pulse Width Distortion 1 ns 2
ICC (Outputs Enabled) ICC 1 2.2 mA Digital Inputs = GND or VCC 2
ICC (Outputs Disabled) ICC 0.6 1 mA Digital Inputs = GND or VCC 2
Supply Voltage VCC VCC -0.3 7 V 3
Driver Input (DI), max = VCC + 0.3 V -0.3 V 3
Control Inputs (DE, RE), max = VCC + 0.3 V -0.3 V 3
Receiver Inputs (A, B) -9 14 V 3
Driver Outputs (A, B) -9 14 V 3
Receiver Output, max = VCC + 0.5 V -0.5 V 3
Power Dissipation 8-Lead SOIC 450 mW 3
Operating Temperature Range, Industrial (A Version) -40 85 °C A Version 3
Storage Temperature Range -65 150 °C 3
Lead Temperature, Soldering 300 °C 10 sec 3
Lead Temperature, Vapor Phase 215 °C 60 sec 3
Lead Temperature, Infrared 220 °C 15 sec 3
Supply voltage tolerance VCC -5 5 % 5 V ± 5% 2
θJA Thermal Impedance, 8-Lead SOIC θJA 170 °C/W 8-Lead SOIC 3
Supply Voltage VCC (nominal) VCC 5 V 5 V ± 5% 2

CAD (KiCad official)

  • Symbol: ADM1485ARZ-REEL7
  • Footprint: Package_SO:SOIC-8_3.9x4.9mm_P1.27mm
  • 3D model: SOIC-8 (KiCad packages3D, STEP)
  • 3D model files: adm1485arz-reel7-etched.step / adm1485arz-reel7-etched.glb carry the MPN laser-etched on the die in a toggleable Adom.LaserEtch group (Fusion-ready); adm1485arz-reel7.step / adm1485arz-reel7.glb are the bare package body.

Provenance

Data extracted from the manufacturer datasheet, not a distributor listing:

  • Datasheet: Analog Devices datasheet (11 pp, sha256 b82bfe64cbc6738f, retrieved 2026-10-18, tier: lcsc)
  • Extractor: parts-factory 2.0.0 / extract_pins 0.3, primary claude-haiku-5-5 (text), consensus claude-sonnet-5-5 (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
  • CAD: KiCad official libraries (CC-BY-SA 4.0).

Datasheet PDF