component
AHW2012C-30NJTF
Public Made by Adomby adom
APV Inductors (SMD), 0805. Unpolarised two-terminal part: the datasheet prints no pin numbers, so pins 1 and 2 follow the library convention, KiCad symbol/footprint/3D.
3D Model
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Symbol & Footprint
Schematic Symbol
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PCB Footprint
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Datasheet
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README
markdownAHW2012C-30NJTF
APV · Inductors (SMD) · 0805
AHW2012C-30NJTF from APV, in a 0805. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | 1 | passive | Terminal 1 of an unpolarised inductor or ferrite bead; either orientation. |
| 2 | 2 | passive | Terminal 2 of an unpolarised inductor or ferrite bead; either orientation. |
Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | APV |
| Package | 0805 |
| Category | Inductors, Coils, Chokes |
| Pins | 2 |
Electrical characteristics
Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| Quality factor Q (min) | Q | 55 | Measured at 500 MHz (printed 55@500MHz) | 6 | |||
| Self-resonant frequency S.R.F (min) | S.R.F | 2400 | MHz | 6 | |||
| DC resistance DCR (max) | DCR | 0.25 | Ω | 6 | |||
| Rating current Irms (max) | Irms | 500 | mA | Temperature rise approx. 40℃ at Irms (page 12 note) | 6 | ||
| Inductance tolerance J (±5%) | -5 | 5 | % | Tolerance code J (±5%) from part numbering table | 1 | ||
| Nominal inductance | L | 30 | nH | Test frequency 250 MHz | 6 | ||
| Operating temperature | -40 | 125 | ℃ | Including self heating | 1 | ||
| Storage temperature | -10 | 40 | ℃ | Storage | 12 | ||
| Storage relative humidity (max) | R.H. | 60 | % | Storage | 12 | ||
| Inductance change ΔL/L after reliability tests (max) | ΔL/L | 10 | % | After reliability tests (e.g. high temperature, endurance, thermal shock), per page 14 table | 14 | ||
| Q change ΔQ/Q after reliability tests (max) | ΔQ/Q | 10 | % | After reliability tests (e.g. high temperature, endurance, thermal shock), per page 14 table | 14 |
CAD (KiCad official)
- Symbol:
AHW2012C-30NJTF - Footprint:
Inductor_SMD:L_0805_2012Metric - 3D model: 0805 (KiCad packages3D, STEP)
- 3D model files:
ahw2012c-30njtf-etched.step/ahw2012c-30njtf-etched.glbcarry the MPN laser-etched on the die in a toggleableAdom.LaserEtchgroup (Fusion-ready);ahw2012c-30njtf.step/ahw2012c-30njtf.glbare the bare package body.
Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- Datasheet: APV datasheet (17 pp, sha256
f17307c621e62181, retrieved 2026-10-17, tier: lcsc) - Extractor: parts-factory
2.0.0/extract_pins, primarytwo-terminal convention(convention), consensusoff(agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish. - CAD: KiCad official libraries (CC-BY-SA 4.0).