component
NCV57200DR2G
Public Made by Adomby adom
onsemi Gate Drivers, SOIC-8. Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.
main
NCV57200DR2G
onsemi · Gate Drivers · SOIC-8
NCV57200DR2G from onsemi, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | VDD | power_in | Low-side and main power supply, recommended up to 20 V, with the UVLO enabling operation above a typical VUVLO1-OUT-ON and a bypass capacitor to GND required close to the pin. |
| 2 | HIN | input | High-side non-inverting gate driver input with a 125 kΩ pull-down, 3.3 V logic thresholds up to VDD, and a minimum pulse width required before HO reacts. |
| 3 | LIN | input | Low-side non-inverting gate driver input with a 125 kΩ pull-down, 3.3 V logic thresholds up to VDD, and a minimum pulse width required before LO reacts. |
| 4 | GND | power_in | Logic ground and low-side driver return. |
| 5 | LO | output | Low-side driver output to the IGBT gate, actively pulled low during startup and UVLO1 condition, with deadtime and interlock preventing cross conduction with HO. |
| 6 | VS | power_in | Bootstrap return or high-side floating supply offset, with the recommended operating range of −800 V to +800 V. |
| 7 | HO | output | Galvanically isolated high-side driver output to the IGBT gate, actively pulled low during startup and UVLO2 condition, with deadtime and interlock preventing cross conduction with LO. |
| 8 | VB | power_in | Bootstrap or high-side floating power supply, recommended up to VS+20 V, requiring a good quality bypass capacitor from VB to VS placed close to the pins. |
Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | onsemi |
| Package | SOIC-8 |
| Category | Motor Driver ICs |
| Pins | 8 |
Electrical characteristics
Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| High-Side Offset Voltage | VS | -900 | 900 | V | 5 | ||
| High-Side Offset Voltage (tp < 500 ns) | -900 | 900 | V | tp < 500 ns | 5 | ||
| High-Side Supply Voltage | VB | -900 | 900 | V | 5 | ||
| High-Side Supply Voltage (tp < 500 ns) | -900 | 900 | V | tp < 500 ns | 5 | ||
| Low-Side and Logic-Fixed Supply Voltage | VDD | -0.3 | 25 | V | 5 | ||
| High-Side Floating Supply Voltage | VBS | -0.3 | 25 | V | 5 | ||
| Allowable Offset Voltage Slew Rate | dVS/dt | -50 | 50 | V/ns | 5 | ||
| Maximum Junction Temperature | TJ(max) | -40 | 150 | °C | 5 | ||
| Storage Temperature Range | TSTG | -65 | 150 | °C | 5 | ||
| ESD Capability, Human Body Model | ESDHBM | -4 | 4 | kV | 5 | ||
| ESD Capability, Charged Device Model | ESDCDM | -2 | 2 | kV | 5 | ||
| High-Side Supply Offset Voltage | VS | -800 | 800 | V | 5 | ||
| Low-Side Supply Voltage | VDD | 20 | V | 5 | |||
| Ambient Temperature | TA | -40 | 125 | °C | 5 | ||
| VBS Supply Under Voltage Output Enabled | VUVLO2−OUT−ON | 11 | 11.5 | 12 | V | 6 | |
| VBS Supply Under Voltage Output Disabled | VUVLO2−OUT−OFF | 10 | 10.5 | 11 | V | 6 | |
| VDD Supply Under Voltage Output Enabled | VUVLO1−OUT−ON | 12 | 12.5 | 13 | V | 6 | |
| VDD Supply Under Voltage Output Disabled | VUVLO1−OUT−OFF | 11 | 11.5 | 12 | V | 6 | |
| Leakage Current Between VS and GND | IHV_LEAK1 | 20 | 200 | nA | VS = ± 800 V, TA = 25°C | 6 | |
| Leakage Current Between VS and GND | IHV_LEAK2 | 600 | nA | VS = ± 800 V, TA = −40°C to 125°C | 6 | ||
| Quiescent Current VBS Supply (VB Only) | IQBS1 | 260 | 325 | A | HO = Low | 6 | |
| Quiescent Current VBS Supply (VB Only) | IQBS2 | 330 | 440 | A | HO = High | 6 | |
| Quiescent Current VDD Supply (VDD Only) | IQDD1 | 380 | 440 | A | VLIN = Float, VHIN = 0 V | 6 | |
| Quiescent Current VDD Supply (VDD Only) | IQDD2 | 440 | 500 | A | VLIN = 3.3 V, VHIN = 0 V | 6 | |
| Quiescent Current VDD Supply (VDD Only) | IQDD3 | 2.4 | 3 | mA | VLIN = 0 V, VHIN = 3.3 V | 6 | |
| Low Level Input Voltage | VIL | 0.9 | V | 6 | |||
| High Level Input Voltage | VIH | 2.4 | V | 6 | |||
| Logic “1” Input Bias Current | ILIN1+, IHIN1+ | 25 | 50 | A | VLIN = 3.3 V, VHIN = 3.3 V | 6 | |
| Logic “1” Input Bias Current | ILIN2+, IHIN2+ | 100 | 150 | A | VLIN = 20 V, VHIN = 20 V, VDD = VBS = 20 V | 6 | |
| Logic “0” Input Bias Current | ILIN−, IHIN− | 40 | 100 | nA | VLIN = 0 V, VHIN = 0 V | 6 | |
| Output Low State | VOL1 | 0.2 | 0.3 | V | ISINK = 200 mA, TA = 25°C | 6 | |
| Output Low State | VOL2 | 0.5 | V | ISINK = 200 mA, TA = −40°C to 125°C | 6 | ||
| Output High State | VOH1 | 14.4 | 14.5 | V | ISRC = 200 mA, TA = 25°C | 6 | |
| Output High State | VOH2 | 14 | V | ISRC = 200 mA, TA = −40°C to 125°C | 6 | ||
| Clamping Voltage (VHO, VB) / (VLO, VDD) | VCLAMP−OUT | 0.8 | 1.3 | V | IHO = 100 mA, ILO = 100 mA (pulse test, tCLPmax = 10 s) | 7 | |
| HO High Propagation Delay | tPD−ON−H | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIH to 10% of Output Change for PW > 150 ns | 7 |
| HO Low Propagation Delay | tPD−OFF−H | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIL to 90% of Output Change for PW > 150 ns | 7 |
| Propagation Delay Distortion(HS) (= tPD−ON − tPD−OFF) | tDISTORT−H | -25 | 0 | 25 | ns | PW >150 ns | 7 |
| LO High Propagation Delay | tPD−ON−L | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIH to 10% of Output Change for PW > 150 ns | 7 |
| LO Low Propagation Delay | tPD−OFF−L | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIL to 90% of Output Change for PW > 150 ns | 7 |
| Propagation Delay Distortion(LS) (= tPD−ON − tPD−OFF) | tDISTORT−L | -25 | 0 | 25 | ns | PW >150 ns | 7 |
| High Prop Delay Distortion between High and Low Sides | tDISTORT−HLH | -25 | 0 | 25 | ns | PW > 150 ns | 7 |
| Low Prop Delay Distortion between High and Low Sides | tDISTORT−HLL | -25 | 0 | 25 | ns | PW > 150 ns | 7 |
| Rise Time(HS) | tRISE−H | 13 | ns | CLOAD = 1 nF, 10% to 90% of Output Change | 7 | ||
| Fall Time(HS) | tFALL−H | 8 | ns | CLOAD = 1 nF, 90% to 10% of Output Change | 7 | ||
| Rise Time(LS) | tRISE−L | 13 | ns | CLOAD = 1 nF, 10% to 90% of Output Change | 7 | ||
| Fall Time(LS) | tFALL−L | 8 | ns | CLOAD = 1 nF, 90% to 10% of Output Change | 7 | ||
| Deadtime Matching | tMDT | 10 | ns | 7 | |||
| Minimum Pulse Width Filtering Time | tMIN1, tMIN2 | 10 | 40 | ns | TA = 25°C | 7 | |
| VDD Supply Voltage Output Enabled/Disabled Hysteresis | VUVLO1−HYST | 1 | V | 6 | |||
| VBS Supply Voltage Output Enabled/Disabled Hysteresis | VUVLO2−HYST | 1 | V | 6 | |||
| Peak Driver Current, Sink | IPK−SNK1 | 2.3 | A | VHO = VLO = 15 V | 6 | ||
| Peak Driver Current, Sink | IPK−SNK2 | 2.1 | A | VHO = VLO = 9 V (near Miller Plateau) | 6 | ||
| Peak Driver Current, Source | IPK−SRC1 | 1.9 | A | VHO = VLO = 0 V | 6 | ||
| Peak Driver Current, Source | IPK−SRC2 | 1.5 | A | VHO = VLO = 9 V (near Miller Plateau) | 6 | ||
| UVLO Fall Delay (HO and LO) | tUV1 | 1300 | ns | 7 | |||
| UVLO Rise Delay (HO and LO) | tUV2 | 1100 | ns | 7 | |||
| Deadtime, HO Delays | tDT1 | 340 | ns | VLIN/HIN = 0 V and 3.3 V | 7 | ||
| Deadtime, LO Delays | tDT2 | 350 | ns | VLIN/HIN = 0 V and 3.3 V | 7 | ||
| Thermal Resistance, Junction−to−Air | RJA | 167 | °C/W | 5 |
CAD (KiCad official)
- Symbol:
NCV57200DR2G - Footprint:
Package_SO:SOIC-8_3.9x4.9mm_P1.27mm - 3D model: SOIC-8 (KiCad packages3D, STEP)
- 3D model files:
ncv57200dr2g-etched.step/ncv57200dr2g-etched.glbcarry the MPN laser-etched on the die in a toggleableAdom.LaserEtchgroup (Fusion-ready);ncv57200dr2g.step/ncv57200dr2g.glbare the bare package body.
Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- Datasheet: onsemi datasheet (12 pp, sha256
422fc58fffa1d1e1, retrieved 2026-10-18, tier: lcsc) - Extractor: parts-factory
2.0.0/extract_pins 0.3, primaryclaude-haiku-5-5(text), consensusclaude-sonnet-5-5(agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish. - CAD: KiCad official libraries (CC-BY-SA 4.0).
# NCV57200DR2G
**onsemi** · Gate Drivers · SOIC-8
NCV57200DR2G from onsemi, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
## Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | VDD | power_in | Low-side and main power supply, recommended up to 20 V, with the UVLO enabling operation above a typical VUVLO1-OUT-ON and a bypass capacitor to GND required close to the pin. |
| 2 | HIN | input | High-side non-inverting gate driver input with a 125 kΩ pull-down, 3.3 V logic thresholds up to VDD, and a minimum pulse width required before HO reacts. |
| 3 | LIN | input | Low-side non-inverting gate driver input with a 125 kΩ pull-down, 3.3 V logic thresholds up to VDD, and a minimum pulse width required before LO reacts. |
| 4 | GND | power_in | Logic ground and low-side driver return. |
| 5 | LO | output | Low-side driver output to the IGBT gate, actively pulled low during startup and UVLO1 condition, with deadtime and interlock preventing cross conduction with HO. |
| 6 | VS | power_in | Bootstrap return or high-side floating supply offset, with the recommended operating range of −800 V to +800 V. |
| 7 | HO | output | Galvanically isolated high-side driver output to the IGBT gate, actively pulled low during startup and UVLO2 condition, with deadtime and interlock preventing cross conduction with LO. |
| 8 | VB | power_in | Bootstrap or high-side floating power supply, recommended up to VS+20 V, requiring a good quality bypass capacitor from VB to VS placed close to the pins. |
## Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | onsemi |
| Package | SOIC-8 |
| Category | Motor Driver ICs |
| Pins | 8 |
## Electrical characteristics
Limits as printed in the datasheet (page.json `metadata.characteristics` carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| High-Side Offset Voltage | VS | -900 | | 900 | V | | 5 |
| High-Side Offset Voltage (tp < 500 ns) | | -900 | | 900 | V | tp < 500 ns | 5 |
| High-Side Supply Voltage | VB | -900 | | 900 | V | | 5 |
| High-Side Supply Voltage (tp < 500 ns) | | -900 | | 900 | V | tp < 500 ns | 5 |
| Low-Side and Logic-Fixed Supply Voltage | VDD | -0.3 | | 25 | V | | 5 |
| High-Side Floating Supply Voltage | VBS | -0.3 | | 25 | V | | 5 |
| Allowable Offset Voltage Slew Rate | dVS/dt | -50 | | 50 | V/ns | | 5 |
| Maximum Junction Temperature | TJ(max) | -40 | | 150 | °C | | 5 |
| Storage Temperature Range | TSTG | -65 | | 150 | °C | | 5 |
| ESD Capability, Human Body Model | ESDHBM | -4 | | 4 | kV | | 5 |
| ESD Capability, Charged Device Model | ESDCDM | -2 | | 2 | kV | | 5 |
| High-Side Supply Offset Voltage | VS | -800 | | 800 | V | | 5 |
| Low-Side Supply Voltage | VDD | | | 20 | V | | 5 |
| Ambient Temperature | TA | -40 | | 125 | °C | | 5 |
| VBS Supply Under Voltage Output Enabled | VUVLO2−OUT−ON | 11 | 11.5 | 12 | V | | 6 |
| VBS Supply Under Voltage Output Disabled | VUVLO2−OUT−OFF | 10 | 10.5 | 11 | V | | 6 |
| VDD Supply Under Voltage Output Enabled | VUVLO1−OUT−ON | 12 | 12.5 | 13 | V | | 6 |
| VDD Supply Under Voltage Output Disabled | VUVLO1−OUT−OFF | 11 | 11.5 | 12 | V | | 6 |
| Leakage Current Between VS and GND | IHV_LEAK1 | | 20 | 200 | nA | VS = ± 800 V, TA = 25°C | 6 |
| Leakage Current Between VS and GND | IHV_LEAK2 | | | 600 | nA | VS = ± 800 V, TA = −40°C to 125°C | 6 |
| Quiescent Current VBS Supply (VB Only) | IQBS1 | | 260 | 325 | A | HO = Low | 6 |
| Quiescent Current VBS Supply (VB Only) | IQBS2 | | 330 | 440 | A | HO = High | 6 |
| Quiescent Current VDD Supply (VDD Only) | IQDD1 | | 380 | 440 | A | VLIN = Float, VHIN = 0 V | 6 |
| Quiescent Current VDD Supply (VDD Only) | IQDD2 | | 440 | 500 | A | VLIN = 3.3 V, VHIN = 0 V | 6 |
| Quiescent Current VDD Supply (VDD Only) | IQDD3 | | 2.4 | 3 | mA | VLIN = 0 V, VHIN = 3.3 V | 6 |
| Low Level Input Voltage | VIL | | | 0.9 | V | | 6 |
| High Level Input Voltage | VIH | 2.4 | | | V | | 6 |
| Logic “1” Input Bias Current | ILIN1+, IHIN1+ | | 25 | 50 | A | VLIN = 3.3 V, VHIN = 3.3 V | 6 |
| Logic “1” Input Bias Current | ILIN2+, IHIN2+ | | 100 | 150 | A | VLIN = 20 V, VHIN = 20 V, VDD = VBS = 20 V | 6 |
| Logic “0” Input Bias Current | ILIN−, IHIN− | | 40 | 100 | nA | VLIN = 0 V, VHIN = 0 V | 6 |
| Output Low State | VOL1 | | 0.2 | 0.3 | V | ISINK = 200 mA, TA = 25°C | 6 |
| Output Low State | VOL2 | | | 0.5 | V | ISINK = 200 mA, TA = −40°C to 125°C | 6 |
| Output High State | VOH1 | 14.4 | 14.5 | | V | ISRC = 200 mA, TA = 25°C | 6 |
| Output High State | VOH2 | 14 | | | V | ISRC = 200 mA, TA = −40°C to 125°C | 6 |
| Clamping Voltage (VHO, VB) / (VLO, VDD) | VCLAMP−OUT | 0.8 | 1.3 | | V | IHO = 100 mA, ILO = 100 mA (pulse test, tCLPmax = 10 s) | 7 |
| HO High Propagation Delay | tPD−ON−H | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIH to 10% of Output Change for PW > 150 ns | 7 |
| HO Low Propagation Delay | tPD−OFF−H | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIL to 90% of Output Change for PW > 150 ns | 7 |
| Propagation Delay Distortion(HS) (= tPD−ON − tPD−OFF) | tDISTORT−H | -25 | 0 | 25 | ns | PW >150 ns | 7 |
| LO High Propagation Delay | tPD−ON−L | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIH to 10% of Output Change for PW > 150 ns | 7 |
| LO Low Propagation Delay | tPD−OFF−L | 60 | 90 | 110 | ns | CLOAD = 1 nF, VIL to 90% of Output Change for PW > 150 ns | 7 |
| Propagation Delay Distortion(LS) (= tPD−ON − tPD−OFF) | tDISTORT−L | -25 | 0 | 25 | ns | PW >150 ns | 7 |
| High Prop Delay Distortion between High and Low Sides | tDISTORT−HLH | -25 | 0 | 25 | ns | PW > 150 ns | 7 |
| Low Prop Delay Distortion between High and Low Sides | tDISTORT−HLL | -25 | 0 | 25 | ns | PW > 150 ns | 7 |
| Rise Time(HS) | tRISE−H | | | 13 | ns | CLOAD = 1 nF, 10% to 90% of Output Change | 7 |
| Fall Time(HS) | tFALL−H | | | 8 | ns | CLOAD = 1 nF, 90% to 10% of Output Change | 7 |
| Rise Time(LS) | tRISE−L | | | 13 | ns | CLOAD = 1 nF, 10% to 90% of Output Change | 7 |
| Fall Time(LS) | tFALL−L | | | 8 | ns | CLOAD = 1 nF, 90% to 10% of Output Change | 7 |
| Deadtime Matching | tMDT | | | 10 | ns | | 7 |
| Minimum Pulse Width Filtering Time | tMIN1, tMIN2 | 10 | | 40 | ns | TA = 25°C | 7 |
| VDD Supply Voltage Output Enabled/Disabled Hysteresis | VUVLO1−HYST | | 1 | | V | | 6 |
| VBS Supply Voltage Output Enabled/Disabled Hysteresis | VUVLO2−HYST | | 1 | | V | | 6 |
| Peak Driver Current, Sink | IPK−SNK1 | | 2.3 | | A | VHO = VLO = 15 V | 6 |
| Peak Driver Current, Sink | IPK−SNK2 | | 2.1 | | A | VHO = VLO = 9 V (near Miller Plateau) | 6 |
| Peak Driver Current, Source | IPK−SRC1 | | 1.9 | | A | VHO = VLO = 0 V | 6 |
| Peak Driver Current, Source | IPK−SRC2 | | 1.5 | | A | VHO = VLO = 9 V (near Miller Plateau) | 6 |
| UVLO Fall Delay (HO and LO) | tUV1 | | 1300 | | ns | | 7 |
| UVLO Rise Delay (HO and LO) | tUV2 | | 1100 | | ns | | 7 |
| Deadtime, HO Delays | tDT1 | | 340 | | ns | VLIN/HIN = 0 V and 3.3 V | 7 |
| Deadtime, LO Delays | tDT2 | | 350 | | ns | VLIN/HIN = 0 V and 3.3 V | 7 |
| Thermal Resistance, Junction−to−Air | RJA | | 167 | | °C/W | | 5 |
## CAD (KiCad official)
- Symbol: `NCV57200DR2G`
- Footprint: `Package_SO:SOIC-8_3.9x4.9mm_P1.27mm`
- 3D model: SOIC-8 (KiCad packages3D, STEP)
- 3D model files: `ncv57200dr2g-etched.step` / `ncv57200dr2g-etched.glb` carry the MPN laser-etched on the die in a toggleable `Adom.LaserEtch` group (Fusion-ready); `ncv57200dr2g.step` / `ncv57200dr2g.glb` are the bare package body.
## Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- **Datasheet:** [onsemi datasheet](https://jlcpcb.com/api/file/downloadByFileSystemAccessId/8589993745375657984) (12 pp, sha256 `422fc58fffa1d1e1`, retrieved 2026-10-18, tier: lcsc)
- **Extractor:** parts-factory `2.0.0` / `extract_pins 0.3`, primary `claude-haiku-5-5` (text), consensus `claude-sonnet-5-5` (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
- **CAD:** KiCad official libraries (CC-BY-SA 4.0).
[Datasheet PDF](docs/ncv57200dr2g-datasheet.pdf)