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MAX14921ECS+T
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Analog Devices Inc Maxim Integrated Battery Management, TQFP-80(12x12). Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.
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Symbol & Footprint
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README
markdownMAX14921ECS+T
Analog Devices Inc Maxim Integrated · Battery Management · TQFP-80(12x12)
MAX14921ECS+T from Analog Devices Inc Maxim Integrated, in a TQFP-80(12x12). Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | SCLK | input | SPI clock input for the daisy-chainable SPI control interface. |
| 2 | SDI | input | SPI data line input. |
| 3 | SDO | output | SPI data line output. |
| 4 | SAMPL | input | Sample control input; CV_ voltages are tracked while SAMPL is logic-high and are held internally when SAMPL transitions from high to low. |
| 5 | VL | power_in | Logic supply input that should be bypassed to DGND with a 0.1µF capacitor placed as close as possible to the device. |
| 6 | DGND | power_in | Digital ground. |
| 7 | T3 | input | Single-ended voltage input that can be connected to a temperature sensor or other analog voltage. |
| 8 | T2 | input | Single-ended voltage input that can be connected to a temperature sensor or other analog voltage. |
| 9 | T1 | input | Single-ended voltage input that can be connected to a temperature sensor or other analog voltage. |
| 10 | AOUT | output | Buffered amplifier output whose voltage is relative to CV0. |
| 11 | AGND | power_in | Low-noise analog ground; connect CV0 to AGND and connect DGND to AGND. |
| 12 | VA | power_out | +5V LDO output that should be bypassed to AGND with a 1µF capacitor placed as close as possible to the device. |
| 13 | LDOIN | power_in | +5V LDO power supply; connect to VP to enable the LDO or to VA to disable the LDO and use an external +5V supply. |
| 14 | VP | power_in | Power supply connected to the highest voltage of the battery cell stack; bypass to AGND with a 0.1µF capacitor placed as close as possible to the device. |
| 15 | CV16 | input | Cell voltage input 16 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 16 | BA16 | output | Cell-balancing gate driver output 16 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 17 | CT16 | passive | Sampling capacitor 16 high terminal that internally connects to CV16 when SAMPL is logic-high; connect a 1µF capacitor between CT16 and CB16, or leave unconnected if not used. |
| 18 | CB16 | passive | Sampling capacitor 16 low terminal that internally connects to CV15 when SAMPL is logic-high; connect a 1µF capacitor between CT16 and CB16, or leave unconnected if not used. |
| 19 | CV15 | input | Cell voltage input 15 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 20 | BA15 | output | Cell-balancing gate driver output 15 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 21 | CT15 | passive | Sampling capacitor 15 high terminal that internally connects to CV15 when SAMPL is logic-high; connect a 1µF capacitor between CT15 and CB15, or leave unconnected if not used. |
| 22 | CB15 | passive | Sampling capacitor 15 low terminal that internally connects to CV14 when SAMPL is logic-high; connect a 1µF capacitor between CT15 and CB15, or leave unconnected if not used. |
| 23 | CV14 | input | Cell voltage input 14 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 24 | BA14 | output | Cell-balancing gate driver output 14 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 25 | CT14 | passive | Sampling capacitor 14 high terminal that internally connects to CV14 when SAMPL is logic-high; connect a 1µF capacitor between CT14 and CB14, or leave unconnected if not used. |
| 26 | CB14 | passive | Sampling capacitor 14 low terminal that internally connects to CV13 when SAMPL is logic-high; connect a 1µF capacitor between CT14 and CB14, or leave unconnected if not used. |
| 27 | CV13 | input | Cell voltage input 13 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 28 | BA13 | output | Cell-balancing gate driver output 13 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 29 | CT13 | passive | Sampling capacitor 13 high terminal that internally connects to CV13 when SAMPL is logic-high; connect a 1µF capacitor between CT13 and CB13, or leave unconnected if not used. |
| 30 | CB13 | passive | Sampling capacitor 13 low terminal that internally connects to CV12 when SAMPL is logic-high; connect a 1µF capacitor between CT13 and CB13, or leave unconnected if not used. |
| 31 | CV12 | input | Cell voltage input 12 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 32 | BA12 | output | Cell-balancing gate driver output 12 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 33 | CT12 | passive | Sampling capacitor 12 high terminal that internally connects to CV12 when SAMPL is logic-high; connect a 1µF capacitor between CT12 and CB12, or leave unconnected if not used. |
| 34 | CB12 | passive | Sampling capacitor 12 low terminal that internally connects to CV11 when SAMPL is logic-high; connect a 1µF capacitor between CT12 and CB12, or leave unconnected if not used. |
| 35 | CV11 | input | Cell voltage input 11 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 36 | BA11 | output | Cell-balancing gate driver output 11 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 37 | CT11 | passive | Sampling capacitor 11 high terminal that internally connects to CV11 when SAMPL is logic-high; connect a 1µF capacitor between CT11 and CB11, or leave unconnected if not used. |
| 38 | CB11 | passive | Sampling capacitor 11 low terminal that internally connects to CV10 when SAMPL is logic-high; connect a 1µF capacitor between CT11 and CB11, or leave unconnected if not used. |
| 39 | CV10 | input | Cell voltage input 10 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 40 | BA10 | output | Cell-balancing gate driver output 10 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 41 | CT10 | passive | Sampling capacitor 10 high terminal that internally connects to CV10 when SAMPL is logic-high; connect a 1µF capacitor between CT10 and CB10, or leave unconnected if not used. |
| 42 | CB10 | passive | Sampling capacitor 10 low terminal that internally connects to CV9 when SAMPL is logic-high; connect a 1µF capacitor between CT10 and CB10, or leave unconnected if not used. |
| 43 | CV9 | input | Cell voltage input 9 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 44 | BA9 | output | Cell-balancing gate driver output 9 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 45 | CT9 | passive | Sampling capacitor 9 high terminal that internally connects to CV9 when SAMPL is logic-high; connect a 1µF capacitor between CT9 and CB9, or leave unconnected if not used. |
| 46 | CB9 | passive | Sampling capacitor 9 low terminal that internally connects to CV8 when SAMPL is logic-high; connect a 1µF capacitor between CT9 and CB9, or leave unconnected if not used. |
| 47 | CV8 | input | Cell voltage input 8 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 48 | BA8 | output | Cell-balancing gate driver output 8 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 49 | CT8 | passive | Sampling capacitor 8 high terminal that internally connects to CV8 when SAMPL is logic-high; connect a 1µF capacitor between CT8 and CB8, or leave unconnected if not used. |
| 50 | CB8 | passive | Sampling capacitor 8 low terminal that internally connects to CV7 when SAMPL is logic-high; connect a 1µF capacitor between CT8 and CB8, or leave unconnected if not used. |
| 51 | CV7 | input | Cell voltage input 7 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 52 | BA7 | output | Cell-balancing gate driver output 7 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 53 | CT7 | passive | Sampling capacitor 7 high terminal that internally connects to CV7 when SAMPL is logic-high; connect a 1µF capacitor between CT7 and CB7, or leave unconnected if not used. |
| 54 | CB7 | passive | Sampling capacitor 7 low terminal that internally connects to CV6 when SAMPL is logic-high; connect a 1µF capacitor between CT7 and CB7, or leave unconnected if not used. |
| 55 | CV6 | input | Cell voltage input 6 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 56 | BA6 | output | Cell-balancing gate driver output 6 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 57 | CT6 | passive | Sampling capacitor 6 high terminal that internally connects to CV6 when SAMPL is logic-high; connect a 1µF capacitor between CT6 and CB6, or leave unconnected if not used. |
| 58 | CB6 | passive | Sampling capacitor 6 low terminal that internally connects to CV7 when SAMPL is logic-high; connect a 1µF capacitor between CT6 and CB6, or leave unconnected if not used. |
| 59 | CV5 | input | Cell voltage input 5 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 60 | BA5 | output | Cell-balancing gate driver output 5 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 61 | CT5 | passive | Sampling capacitor 5 high terminal that internally connects to CV5 when SAMPL is logic-high; connect a 1µF capacitor between CT5 and CB5, or leave unconnected if not used. |
| 62 | CB5 | passive | Sampling capacitor 5 low terminal that internally connects to CV4 when SAMPL is logic-high; connect a 1µF capacitor between CT5 and CB5, or leave unconnected if not used. |
| 63 | CV4 | input | Cell voltage input 4 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 64 | BA4 | output | Cell-balancing gate driver output 4 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 65 | CT4 | passive | Sampling capacitor 4 high terminal that internally connects to CV4 when SAMPL is logic-high; connect a 1µF capacitor between CT4 and CB4, or leave unconnected if not used. |
| 66 | CB4 | passive | Sampling capacitor 4 low terminal that internally connects to CV3 when SAMPL is logic-high; connect a 1µF capacitor between CT4 and CB4, or leave unconnected if not used. |
| 67 | CV3 | input | Cell voltage input 3 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 68 | BA3 | output | Cell-balancing gate driver output 3 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 69 | CT3 | passive | Sampling capacitor 3 high terminal that internally connects to CV3 when SAMPL is logic-high; connect a 1µF capacitor between CT3 and CB3, or leave unconnected if not used. |
| 70 | CB3 | passive | Sampling capacitor 3 low terminal that internally connects to CV2 when SAMPL is logic-high; connect a 1µF capacitor between CT3 and CB3, or leave unconnected if not used. |
| 71 | CV2 | input | Cell voltage input 2 connected to cell anode/cathode; connect to the highest voltage of the battery cell stack if not used. |
| 72 | BA2 | output | Cell-balancing gate driver output 2 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 73 | CT2 | passive | Sampling capacitor 2 high terminal that internally connects to CV2 when SAMPL is logic-high; connect a 1µF capacitor between CT2 and CB2, or leave unconnected if not used. |
| 74 | CB2 | passive | Sampling capacitor 2 low terminal that internally connects to CV1 when SAMPL is logic-high; connect a 1µF capacitor between CT2 and CB2, or leave unconnected if not used. |
| 75 | CV1 | input | Cell voltage input 1 connected to cell anode/cathode. |
| 76 | BA1 | output | Cell-balancing gate driver output 1 that connects to the gate of an external n-channel FET; leave unconnected if not used. |
| 77 | CT1 | passive | Sampling capacitor connection 1 high terminal that internally connects to CV1 when SAMPL is logic-high; connect a 1µF capacitor between CT1 and CV0, or leave unconnected if not used. |
| 78 | CV0 | input | Cell voltage input 0 that must be connected to AGND. |
| 79 | EN | input | Enable input; drive low to put the device into shutdown mode and reset the SPI registers (the +5V LDO remains active), and drive high for normal operation. |
| 80 | CS | input | SPI chip-select input, active low. |
Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | Analog Devices Inc Maxim Integrated |
| Package | TQFP-80(12x12) |
| Category | Power Management (PMIC) |
| Pins | 80 |
Electrical characteristics
Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| VP pin voltage (absolute maximum) | VP | -0.3 | 70 | V | Referenced to AGND | 2 | |
| VA pin voltage (absolute maximum) | VA | -0.3 | 6 | V | Referenced to AGND | 2 | |
| VL pin voltage (absolute maximum) | VL | -0.3 | 5.5 | V | Referenced to AGND | 2 | |
| CV0, DGND pin voltage (absolute maximum) | CV0, DGND | -0.3 | 0.3 | V | Referenced to AGND | 2 | |
| SCLK, SDI, CS, EN pin voltage (absolute maximum) | SCLK, SDI, CS, EN | -0.3 | 6 | V | Referenced to AGND | 2 | |
| CV1 pin voltage (absolute maximum) | CV1 | -0.3 | 6 | V | Referenced to AGND | 2 | |
| Operating temperature range | TA | -40 | 85 | °C | 2 | ||
| Maximum junction temperature | TJ | 150 | °C | 2 | |||
| Storage temperature range | TSTG | -65 | 150 | °C | 2 | ||
| Lead temperature (soldering) | 300 | °C | Soldering, 10s | 2 | |||
| Soldering temperature (reflow) | 260 | °C | Reflow | 2 | |||
| VP supply voltage | VP | 6 | 65 | V | 2 | ||
| LDOIN supply voltage | VLDOIN | 6 | 65 | V | 2 | ||
| LDOIN supply current, LDO off | ILDOIN_OFF | 75 | 125 | µA | EN = low, IA = 0A | 2 | |
| LDOIN supply current, LDO on | ILDOIN_ON | 350 | 500 | µA | EN = high, IA = 0A | 2 | |
| VA analog supply voltage | VA | 4.75 | 5 | 5.25 | V | VA supply externally, VA = VLDOIN | 2 |
| VA analog supply current, off | IA_OFF | 50 | 75 | µA | EN = low, VA = VLDOIN | 2 | |
| VA analog supply current, on | IA_ON | 350 | 450 | µA | EN = high, VA = VLDOIN | 2 | |
| VL supply voltage | VL | 1.62 | 5.5 | V | 2 | ||
| VL supply current | IL | 2.5 | 5 | µA | All logic inputs static, held at logic-low or logic-high | 2 | |
| VP supply current, on | IP_ON | 65 | 150 | µA | EN = high | 2 | |
| LDOIN UVLO threshold | UV_LDOINVT | 5.25 | 6 | V | VLDOIN rising | 3 | |
| LDO output voltage | VA_LDO_OUT | 4.75 | 5 | 5.25 | V | 0 < ILOAD < 10mA | 3 |
| Analog input signal range (T_) | VT | 0 | V | Reference to AGND | 3 | ||
| Input leakage current, T_ route to buffer amplifier | IT_LEAK | -1 | 1 | µA | T_ route to buffer amplifier | 3 | |
| Input leakage current, T_ route to AOUT | IT_LEAK | -1 | 1 | µA | T_ route to AOUT | 3 | |
| Capacitor discharge current | ILT_ | -1 | 1 | µA | Hold phase, SAMPL = low | 3 | |
| Differential input signal range for guaranteed accuracy | VDn | 0.5 | 4.5 | V | VCVn, VCVn-1 (Note 3) | 3 | |
| CV1 input voltage range | VCV1 | 0 | 5 | V | 3 | ||
| CV2-CV16 input voltage range (MAX14921) | VCVm | 1.5 | 65 | V | m ≥ 2, VCVm ≥ VCVm-1 (Note 3) | 3 | |
| Input leakage current, sampling phase | ILS_ | -1 | 1 | µA | During sampling phase | 3 | |
| Input leakage current, holding phase | ILH_ | -1 | 10 | µA | During holding phase | 3 | |
| Input leakage current, calibration | ILC_ | -1 | 10 | µA | During calibration | 3 | |
| Balancing input current | ILB_ | 6.5 | 12 | mA | BA_ active, VCVn - VCVn-1 = +4.5V (Note 3) | 3 | |
| Sample switch on-resistance | RSAMPLE | 80 | 150 | Ω | VCVn > +2V, ISINK = 2mA (Note 3) | 3 | |
| Sample switch on-resistance during charge injection error calibration | RSWCAL | 800 | 16000 | Ω | VCVn > +2V, ISINK = 2mA (Note 3), during charge injection error calibration | 3 | |
| Cell undervoltage threshold | UV_VCVTH | 1.4 | 1.5 | 1.6 | V | An undervoltage sets the associated SPI Cn bit | 3 |
| AOUT output signal range | VAOUT | 0.3 | V | Reference to AGND | 4 | ||
| Amplifier offset voltage | VOFFSET | -100 | 100 | µV | VAOUT = +3.3V, after self-calibration (Note 5) | 4 | |
| Temperature offset drift | -1.5 | 1.5 | µV/°C | If not recalibrated | 4 | ||
| Output error | VO_ERR | -0.5 | 0.5 | mV | (Note 4) | 4 | |
| Amplifier gain error | VGAIN_ERR | -0.2 | 0.2 | mV | ROUT = 100kΩ, VD = 2V to 4.5V (Note 6) | 4 | |
| VP monitor accuracy | VPMONA | -0.25 | 0 | 2.5 | % | [SC0, SC1, SC2, SC3] = [0, 0, 1, 1] | 4 |
| Pulldown resistance (charge-balance drivers) | RPDWN | 10.5 | 14.8 | 21.5 | kΩ | 4 | |
| SDO output low voltage | VOL | 0.4 | V | ISINK = 10mA | 4 | ||
| SDO output leakage current | IL | -1 | 1 | µA | VCS = VL | 4 | |
| Logic input leakage current (SDI, SCLK, EN, SAMPL) | IL | -1 | 1 | µA | 4 | ||
| Level-shifting delay time | tLS_DELAY | 25 | 50 | µs | Delay from SMPLB set to 1 or SAMPL falling edge to shifting of all cell voltages to ground and available for reading | 5 | |
| VP settling time | tVPS | 25 | 60 | µs | Measured between VP/12 (MAX14920), VP/16 (MAX14921) input selection and AOUT, settling to 2.5%, CLOAD = 100pF, SC3 = 1 | 5 | |
| Thermal shutdown | 140 | °C | 5 | ||||
| Thermal shutdown hysteresis | 15 | °C | 5 | ||||
| VP supply current, off | IP_OFF | 1 | µA | EN = low or LOPW = 1 | 2 | ||
| VP UVLO threshold | UV_VPVTH | 6 | V | VP rising | 3 | ||
| UVLO hysteresis (VP) | UV_VPHYST | 200 | mV | 3 | |||
| VA UVLO threshold | UV_VAVTH | 4.7 | V | VA rising | 3 | ||
| VL UVLO threshold | UV_VLVTH | 1.6 | V | VL rising | 3 | ||
| Amplifier gain | A_V | 1 | V/V | Gain = VAOUT/VD | 4 |
CAD (KiCad official)
- Symbol:
MAX14921ECS+T - Footprint:
Package_QFP:TQFP-80_12x12mm_P0.5mm - 3D model: TQFP-80(12x12) (KiCad packages3D, STEP)
- 3D model files:
max14921ecs-t-etched.step/max14921ecs-t-etched.glbcarry the MPN laser-etched on the die in a toggleableAdom.LaserEtchgroup (Fusion-ready);max14921ecs-t.step/max14921ecs-t.glbare the bare package body.
Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- Datasheet: Analog Devices Inc Maxim Integrated datasheet (30 pp, sha256
f2fc78d7eb80734b, retrieved 2026-10-19, tier: lcsc) - Extractor: parts-factory
2.0.0/extract_pins 0.3, primaryclaude-haiku-5-5(text), consensusclaude-sonnet-5-5(agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish. - CAD: KiCad official libraries (CC-BY-SA 4.0).