component
FM25V05-GTR
Public Made by Adomby adom
Infineon Cypress Semicon FRAM, SOIC-8. Pinout reviewed by a person against the datasheet, KiCad symbol/footprint/3D.
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FM25V05-GTR
Infineon Cypress Semicon · FRAM · SOIC-8
FM25V05-GTR from Infineon Cypress Semicon, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | HOLD | input | Active-LOW input that suspends current memory operations; has weak internal pull-up (40 kΩ minimum) and must be tied to VDD if unused. |
| 2 | SCK | input | Serial clock input for synchronizing all I/O activity; accepts clock frequencies from 0 to 40 MHz with inputs latched on rising edge and outputs occurring on falling edge. |
| 3 | SI | input | Serial input pin for all data; sampled on rising edge of SCK and must be driven to valid logic level to meet IDD specifications. |
| 4 | SO | tri_state | Serial output pin for read data; driven on falling edge of SCK and tristated when HOLD is LOW or device is deselected. |
| 5 | VSS | power_in | Ground connection for device; must be connected to system ground. |
| 6 | WP | input | Active-LOW write protect input that prevents Status Register writes when WPEN bit is set to 1; must be tied to VDD if unused. |
| 7 | VDD | power_in | Power supply input; operating range 2.0 V to 3.6 V over industrial temperature range -40 °C to +85 °C. |
| 8 | CS | input | Active-LOW chip select input that activates device; device enters low-power standby mode and tristates output when CS is HIGH. |
Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | Infineon Cypress Semicon |
| Package | SOIC-8 |
| Category | Memory |
| Pins | 8 |
Electrical characteristics
Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| Storage temperature | TSTG | -55 | 125 | °C | 13 | ||
| Ambient temperature with power applied | TA | -55 | 125 | °C | Power applied | 13 | |
| Supply voltage on VDD relative to VSS | VDD | -1 | 4.5 | V | Relative to VSS | 13 | |
| Input voltage | VIN | -1 | 4.5 | V | VIN < VDD + 1.0 V | 13 | |
| DC voltage applied to outputs in High-Z state | VOUT | -0.5 | V | Outputs in High-Z state | 13 | ||
| Transient voltage on any pin to ground potential | -2 | V | < 20 ns | 13 | |||
| DC output current | IOUT | 15 | mA | 1 output at a time, 1 s duration | 13 | ||
| Ambient operating temperature (industrial) | TA | -40 | 85 | °C | Industrial range | 13 | |
| Thermal resistance junction to ambient (8-pin SOIC) | JA | 138 | °C/W | Per EIA/JESD51 | 14 | ||
| Thermal resistance junction to case (8-pin SOIC) | JC | 40 | °C/W | 14 | |||
| Power supply voltage | VDD | 2 | 3.3 | 3.6 | V | 13 | |
| VDD supply current | IDD | 0.3 | mA | SCK toggling between VDD, 0.2 V and VSS, other inputs VSS or VDD, 0.2 V; SO = Open; fSCK = 1 MHz | 13 | ||
| VDD supply current | IDD | 1.5 | 3 | mA | SCK toggling between VDD, 0.2 V and VSS, other inputs VSS or VDD, 0.2 V; SO = Open; fSCK = 40 MHz | 13 | |
| VDD standby current | ISB | 90 | 150 | µA | CS = VDD; all other inputs VSS or VDD | 13 | |
| Input leakage current (except HOLD pin) | ILI | -1 | 1 | µA | VSS < VIN < VDD | 13 | |
| Output leakage current | ILO | -1 | 1 | µA | VSS < VOUT < VDD | 13 | |
| Input LOW voltage | VIL | -0.3 | V | 13 | |||
| Output HIGH voltage | VOH1 | 2.4 | V | IOH = -1 mA, VDD = 2.7 V | 13 | ||
| Output LOW voltage | VOL1 | 0.4 | V | IOL = 2 mA, VDD = 2.7 V | 13 | ||
| Output LOW voltage | VOL2 | 0.2 | V | IOL = 150 µA | 13 | ||
| Input resistance (HOLD pin) | RIN | 40 | kΩ | For VIN = VIH(min) | 13 | ||
| Input resistance (HOLD pin) | RIN | 1 | MΩ | For VIN = VIL(max) | 13 | ||
| Data retention | TDR | 10 | Years | TA = 85 C | 14 | ||
| Data retention | TDR | 38 | Years | TA = 75 C | 14 | ||
| Data retention | TDR | 151 | Years | TA = 65 C | 14 | ||
| Output pin capacitance (SO) | CO | 8 | pF | TA = 25 C, f = 1 MHz, VDD = VDD(typ) | 14 | ||
| Input pin capacitance | CI | 6 | pF | 14 | |||
| SCK clock frequency | fSCK | 0 | 25 | MHz | VDD = 2.0 V to 2.7 V | 15 | |
| SCK clock frequency | fSCK | 0 | 40 | MHz | VDD = 2.7 V to 3.6 V | 15 | |
| Clock HIGH time | tCH | 20 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Clock HIGH time | tCH | 11 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Clock LOW time | tCL | 20 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Clock LOW time | tCL | 11 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Chip select setup | tCSU | 12 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Chip select setup | tCSU | 10 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Chip select hold | tCSH | 12 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Chip select hold | tCSH | 10 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Output disable time | tOD | 20 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Output disable time | tOD | 12 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Output data valid time | tODV | 18 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Output data valid time | tODV | 9 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Data in rise time | tR | 50 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Data in fall time | tF | 50 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Data setup time | tSU | 8 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Data setup time | tSU | 5 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Data hold time | tH | 8 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| Data hold time | tH | 5 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| HOLD setup time | tHS | 12 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| HOLD setup time | tHS | 10 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| HOLD LOW to HI-Z | tHZ | 25 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| HOLD LOW to HI-Z | tHZ | 20 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| HOLD HIGH to data active | tLZ | 25 | ns | VDD = 2.0 V to 2.7 V | 15 | ||
| HOLD HIGH to data active | tLZ | 20 | ns | VDD = 2.7 V to 3.6 V | 15 | ||
| Power-up VDD(min) to first access (CS LOW) | tPU | 250 | µs | VDD(min) to first access | 17 | ||
| VDD power-up ramp rate | tVR | 50 | µs/V | 17 | |||
| VDD power-down ramp rate | tVF | 100 | µs/V | 17 | |||
| Recovery time from sleep mode | tREC | 400 | µs | 17 |
CAD (KiCad official)
- Symbol:
FM25V05-GTR - Footprint:
Package_SO:SOIC-8_3.9x4.9mm_P1.27mm - 3D model: SOIC-8 (KiCad packages3D, STEP)
- 3D model files:
fm25v05-gtr-etched.step/fm25v05-gtr-etched.glbcarry the MPN laser-etched on the die in a toggleableAdom.LaserEtchgroup (Fusion-ready);fm25v05-gtr.step/fm25v05-gtr.glbare the bare package body.
Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- Datasheet: Infineon Cypress Semicon datasheet (22 pp, sha256
d1dce7dcdcc9a6f2, retrieved 2026-10-21, tier: lcsc) - Extractor:
ds2sf(Claude). Every pin and dimension is cited to a datasheet page; it refuses to fabricate. - CAD: KiCad official libraries (CC-BY-SA 4.0).
# FM25V05-GTR
**Infineon Cypress Semicon** · FRAM · SOIC-8
FM25V05-GTR from Infineon Cypress Semicon, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
## Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | HOLD | input | Active-LOW input that suspends current memory operations; has weak internal pull-up (40 kΩ minimum) and must be tied to VDD if unused. |
| 2 | SCK | input | Serial clock input for synchronizing all I/O activity; accepts clock frequencies from 0 to 40 MHz with inputs latched on rising edge and outputs occurring on falling edge. |
| 3 | SI | input | Serial input pin for all data; sampled on rising edge of SCK and must be driven to valid logic level to meet IDD specifications. |
| 4 | SO | tri_state | Serial output pin for read data; driven on falling edge of SCK and tristated when HOLD is LOW or device is deselected. |
| 5 | VSS | power_in | Ground connection for device; must be connected to system ground. |
| 6 | WP | input | Active-LOW write protect input that prevents Status Register writes when WPEN bit is set to 1; must be tied to VDD if unused. |
| 7 | VDD | power_in | Power supply input; operating range 2.0 V to 3.6 V over industrial temperature range -40 °C to +85 °C. |
| 8 | CS | input | Active-LOW chip select input that activates device; device enters low-power standby mode and tristates output when CS is HIGH. |
## Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | Infineon Cypress Semicon |
| Package | SOIC-8 |
| Category | Memory |
| Pins | 8 |
## Electrical characteristics
Limits as printed in the datasheet (page.json `metadata.characteristics` carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| Storage temperature | TSTG | -55 | | 125 | °C | | 13 |
| Ambient temperature with power applied | TA | -55 | | 125 | °C | Power applied | 13 |
| Supply voltage on VDD relative to VSS | VDD | -1 | | 4.5 | V | Relative to VSS | 13 |
| Input voltage | VIN | -1 | | 4.5 | V | VIN < VDD + 1.0 V | 13 |
| DC voltage applied to outputs in High-Z state | VOUT | -0.5 | | | V | Outputs in High-Z state | 13 |
| Transient voltage on any pin to ground potential | | -2 | | | V | < 20 ns | 13 |
| DC output current | IOUT | | | 15 | mA | 1 output at a time, 1 s duration | 13 |
| Ambient operating temperature (industrial) | TA | -40 | | 85 | °C | Industrial range | 13 |
| Thermal resistance junction to ambient (8-pin SOIC) | JA | | 138 | | °C/W | Per EIA/JESD51 | 14 |
| Thermal resistance junction to case (8-pin SOIC) | JC | | 40 | | °C/W | | 14 |
| Power supply voltage | VDD | 2 | 3.3 | 3.6 | V | | 13 |
| VDD supply current | IDD | | | 0.3 | mA | SCK toggling between VDD, 0.2 V and VSS, other inputs VSS or VDD, 0.2 V; SO = Open; fSCK = 1 MHz | 13 |
| VDD supply current | IDD | | 1.5 | 3 | mA | SCK toggling between VDD, 0.2 V and VSS, other inputs VSS or VDD, 0.2 V; SO = Open; fSCK = 40 MHz | 13 |
| VDD standby current | ISB | | 90 | 150 | µA | CS = VDD; all other inputs VSS or VDD | 13 |
| Input leakage current (except HOLD pin) | ILI | -1 | | 1 | µA | VSS < VIN < VDD | 13 |
| Output leakage current | ILO | -1 | | 1 | µA | VSS < VOUT < VDD | 13 |
| Input LOW voltage | VIL | -0.3 | | | V | | 13 |
| Output HIGH voltage | VOH1 | 2.4 | | | V | IOH = -1 mA, VDD = 2.7 V | 13 |
| Output LOW voltage | VOL1 | | | 0.4 | V | IOL = 2 mA, VDD = 2.7 V | 13 |
| Output LOW voltage | VOL2 | | | 0.2 | V | IOL = 150 µA | 13 |
| Input resistance (HOLD pin) | RIN | 40 | | | kΩ | For VIN = VIH(min) | 13 |
| Input resistance (HOLD pin) | RIN | 1 | | | MΩ | For VIN = VIL(max) | 13 |
| Data retention | TDR | 10 | | | Years | TA = 85 C | 14 |
| Data retention | TDR | 38 | | | Years | TA = 75 C | 14 |
| Data retention | TDR | 151 | | | Years | TA = 65 C | 14 |
| Output pin capacitance (SO) | CO | | | 8 | pF | TA = 25 C, f = 1 MHz, VDD = VDD(typ) | 14 |
| Input pin capacitance | CI | | | 6 | pF | | 14 |
| SCK clock frequency | fSCK | 0 | | 25 | MHz | VDD = 2.0 V to 2.7 V | 15 |
| SCK clock frequency | fSCK | 0 | | 40 | MHz | VDD = 2.7 V to 3.6 V | 15 |
| Clock HIGH time | tCH | 20 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| Clock HIGH time | tCH | 11 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| Clock LOW time | tCL | 20 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| Clock LOW time | tCL | 11 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| Chip select setup | tCSU | 12 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| Chip select setup | tCSU | 10 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| Chip select hold | tCSH | 12 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| Chip select hold | tCSH | 10 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| Output disable time | tOD | | | 20 | ns | VDD = 2.0 V to 2.7 V | 15 |
| Output disable time | tOD | | | 12 | ns | VDD = 2.7 V to 3.6 V | 15 |
| Output data valid time | tODV | | | 18 | ns | VDD = 2.0 V to 2.7 V | 15 |
| Output data valid time | tODV | | | 9 | ns | VDD = 2.7 V to 3.6 V | 15 |
| Data in rise time | tR | | | 50 | ns | VDD = 2.0 V to 2.7 V | 15 |
| Data in fall time | tF | | | 50 | ns | VDD = 2.0 V to 2.7 V | 15 |
| Data setup time | tSU | 8 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| Data setup time | tSU | 5 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| Data hold time | tH | 8 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| Data hold time | tH | 5 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| HOLD setup time | tHS | 12 | | | ns | VDD = 2.0 V to 2.7 V | 15 |
| HOLD setup time | tHS | 10 | | | ns | VDD = 2.7 V to 3.6 V | 15 |
| HOLD LOW to HI-Z | tHZ | | | 25 | ns | VDD = 2.0 V to 2.7 V | 15 |
| HOLD LOW to HI-Z | tHZ | | | 20 | ns | VDD = 2.7 V to 3.6 V | 15 |
| HOLD HIGH to data active | tLZ | | | 25 | ns | VDD = 2.0 V to 2.7 V | 15 |
| HOLD HIGH to data active | tLZ | | | 20 | ns | VDD = 2.7 V to 3.6 V | 15 |
| Power-up VDD(min) to first access (CS LOW) | tPU | 250 | | | µs | VDD(min) to first access | 17 |
| VDD power-up ramp rate | tVR | 50 | | | µs/V | | 17 |
| VDD power-down ramp rate | tVF | 100 | | | µs/V | | 17 |
| Recovery time from sleep mode | tREC | | | 400 | µs | | 17 |
## CAD (KiCad official)
- Symbol: `FM25V05-GTR`
- Footprint: `Package_SO:SOIC-8_3.9x4.9mm_P1.27mm`
- 3D model: SOIC-8 (KiCad packages3D, STEP)
- 3D model files: `fm25v05-gtr-etched.step` / `fm25v05-gtr-etched.glb` carry the MPN laser-etched on the die in a toggleable `Adom.LaserEtch` group (Fusion-ready); `fm25v05-gtr.step` / `fm25v05-gtr.glb` are the bare package body.
## Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- **Datasheet:** [Infineon Cypress Semicon datasheet](https://jlcpcb.com/api/file/downloadByFileSystemAccessId/8586186372650569728) (22 pp, sha256 `d1dce7dcdcc9a6f2`, retrieved 2026-10-21, tier: lcsc)
- **Extractor:** `ds2sf` (Claude). Every pin and dimension is cited to a datasheet page; it refuses to fabricate.
- **CAD:** KiCad official libraries (CC-BY-SA 4.0).
[Datasheet PDF](docs/fm25v05-gtr-datasheet.pdf)