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CY15B102QN-50SXE
Public Made by Adomby adom
Cypress Semicon Pre-ordered Products, SOIC-8. Pinout cross-checked by two models against the datasheet, KiCad symbol/footprint/3D.
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CY15B102QN-50SXE
Cypress Semicon · Pre-ordered Products · SOIC-8
CY15B102QN-50SXE from Cypress Semicon, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | CS | input | Active LOW chip select that activates the device; when HIGH the device enters low-power standby, ignores other inputs and tristates the output, and a falling edge on CS must occur before every opcode. |
| 2 | SO | output | Serial data output, driven during a read and tristated at all other times, with data transitions on the falling edge of SCK. |
| 3 | WP | input | Active LOW write protect that prevents writes to the status register when the WPEN bit is set to 1; must be tied to VDD if not used. |
| 4 | VSS | power_in | Ground for the device, must be connected to the system ground. |
| 5 | SI | input | Serial data input sampled on the rising edge of SCK and ignored at other times; must always be driven to a valid logic level to meet IDD specifications, and may be connected to SO for a single-pin data interface. |
| 6 | SCK | input | Serial clock that synchronizes all I/O activity, latching inputs on the rising edge with outputs on the falling edge, at any frequency from 0 to 50 MHz. |
| 7 | DNU | passive | Do not use; leave floating (not connected on the board) or tie to VDD. |
| 8 | VDD | power_in | Power supply input to the device (1.8 V to 3.6 V for CY15B102QN). |
Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | Cypress Semicon |
| Package | SOIC-8 |
| Category | Electronic Tools/Instruments/Consumables |
| Pins | 8 |
Electrical characteristics
Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| Power supply voltage | VDD | 1.8 | 3.3 | 3.6 | V | CY15B102QN | 25 |
| Ambient temperature (Automotive-E) | TA | -40 | 125 | °C | Operating range | 24 | |
| Storage temperature | -65 | 150 | °C | 23 | |||
| Maximum junction temperature | 135 | °C | 23 | ||||
| Supply voltage on VDD relative to VSS | VDD | -0.5 | 4.1 | V | CY15B102QN | 23 | |
| Package power dissipation capability | 1 | W | TA = 25°C | 23 | |||
| Surface mount lead soldering temperature | 260 | °C | 3 seconds | 23 | |||
| DC output current | 15 | mA | 1 output at a time, 1s duration | 23 | |||
| ESD voltage, Human Body Model | 2 | kV | JESD22-A114-B | 23 | |||
| ESD voltage, Charged Device Model | 500 | V | JESD22-C101-A | 23 | |||
| VDD supply current | IDD | 0.5 | 1.4 | mA | VDD = 1.8 V to 3.6 V; fSCK = 1 MHz; SO = Open | 25 | |
| VDD supply current | IDD | 4.3 | 8 | mA | VDD = 1.8 V to 3.6 V; fSCK = 40 MHz; SO = Open | 25 | |
| VDD supply current | IDD | 6 | 8 | mA | VDD = 1.8 V to 3.6 V; fSCK = 50 MHz; SO = Open | 25 | |
| VDD standby current | ISB | 3.2 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 25°C | 25 | ||
| VDD standby current | ISB | 75 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 85°C | 25 | ||
| VDD standby current | ISB | 350 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 125°C | 25 | ||
| Deep power-down current | IDPD | 1.3 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 25°C | 25 | ||
| Deep power-down current | IDPD | 17 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 85°C | 25 | ||
| Deep power-down current | IDPD | 80 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 125°C | 25 | ||
| Hibernate mode current | IHBN | 0.1 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 25°C | 25 | ||
| Hibernate mode current | IHBN | 1.6 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 85°C | 25 | ||
| Hibernate mode current | IHBN | 14 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 125°C | 25 | ||
| Input leakage current on I/O pins except WP pin | ILI | -5 | 5 | µA | VSS < VIN < VDD | 25 | |
| Input leakage current on WP pin | ILI | -100 | 5 | µA | VSS < VIN < VDD | 25 | |
| Output leakage current | ILO | -5 | 5 | µA | VSS < VOUT < VDD | 26 | |
| Input LOW voltage | VIL | -0.3 | V | max is 0.3 × VDD as printed | 26 | ||
| Output HIGH voltage | VOH1 | 2.4 | V | IOH = -1 mA, VDD = 2.7 V | 26 | ||
| Output LOW voltage | VOL1 | 0.4 | V | IOL = 2 mA, VDD = 2.7 V | 26 | ||
| Output LOW voltage | VOL2 | 0.2 | V | IOL = 150 µA | 26 | ||
| Data retention | TDR | 11000 | Hours | TA = 125°C | 27 | ||
| Data retention | TDR | 11 | Years | TA = 105°C | 27 | ||
| Data retention | TDR | 121 | Years | TA = 85°C | 27 | ||
| SCK clock frequency | fSCK | 0 | 50 | MHz | 50 MHz column | 32 | |
| Clock HIGH time | tCH | 9 | ns | 50 MHz column | 32 | ||
| Clock LOW time | tCL | 9 | ns | 50 MHz column | 32 | ||
| Chip select setup | tCSS | 5 | ns | 50 MHz column | 32 | ||
| Chip select hold - SPI mode 0 | tCSH | 5 | ns | 50 MHz column | 32 | ||
| Chip select hold - SPI mode 3 | tCSH1 | 10 | ns | 50 MHz column | 32 | ||
| Output disable time | tHZCS | 10 | ns | 50 MHz column | 32 | ||
| Output data valid time | tCO | 8 | ns | 50 MHz column | 32 | ||
| Output hold time | tOH | 1 | ns | 50 MHz column | 32 | ||
| Deselect time | tCS | 40 | ns | 50 MHz column | 32 | ||
| Data setup time | tSD | 5 | ns | 50 MHz column | 32 | ||
| Data hold time | tHD | 5 | ns | 50 MHz column | 32 | ||
| WP setup time (w.r.t CS) | tWPS | 20 | ns | 50 MHz column | 32 | ||
| WP hold time (w.r.t CS) | tWPH | 20 | ns | 50 MHz column | 32 | ||
| Power-up VDD(min) to first access (CS LOW) | tPU | 450 | µs | 34 | |||
| VDD power-up ramp rate | tVR | 30 | µs/V | 34 | |||
| VDD power-down ramp rate | tVF | 20 | µs/V | 34 | |||
| CS HIGH to enter deep power-down | tENTDPD | 3 | µs | 34 | |||
| Recovery time from deep power-down mode | tEXTDPD | 10 | µs | CS LOW to ready for access | 34 | ||
| CS HIGH to enter hibernate | tENTHIB | 3 | µs | 34 | |||
| Recovery time from hibernate mode | tEXTHIB | 450 | µs | CS LOW to ready for access | 34 | ||
| Low VDD where initialization must occur | VDD(low) | 0.6 | V | 34 |
CAD (KiCad official)
- Symbol:
CY15B102QN-50SXE - Footprint:
Package_SO:SOIC-8_3.9x4.9mm_P1.27mm - 3D model: SOIC-8 (KiCad packages3D, STEP)
- 3D model files:
cy15b102qn-50sxe-etched.step/cy15b102qn-50sxe-etched.glbcarry the MPN laser-etched on the die in a toggleableAdom.LaserEtchgroup (Fusion-ready);cy15b102qn-50sxe.step/cy15b102qn-50sxe.glbare the bare package body.
Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- Datasheet: Cypress Semicon datasheet (44 pp, sha256
9412812a28df342f, retrieved 2026-11-02, tier: lcsc) - Extractor: parts-factory
2.0.0/extract_pins 0.3, primaryclaude-sonnet-5-5(text), consensusclaude-opus-5-5(agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish. - CAD: KiCad official libraries (CC-BY-SA 4.0).
# CY15B102QN-50SXE
**Cypress Semicon** · Pre-ordered Products · SOIC-8
CY15B102QN-50SXE from Cypress Semicon, in a SOIC-8. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.
## Pinout
| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | CS | input | Active LOW chip select that activates the device; when HIGH the device enters low-power standby, ignores other inputs and tristates the output, and a falling edge on CS must occur before every opcode. |
| 2 | SO | output | Serial data output, driven during a read and tristated at all other times, with data transitions on the falling edge of SCK. |
| 3 | WP | input | Active LOW write protect that prevents writes to the status register when the WPEN bit is set to 1; must be tied to VDD if not used. |
| 4 | VSS | power_in | Ground for the device, must be connected to the system ground. |
| 5 | SI | input | Serial data input sampled on the rising edge of SCK and ignored at other times; must always be driven to a valid logic level to meet IDD specifications, and may be connected to SO for a single-pin data interface. |
| 6 | SCK | input | Serial clock that synchronizes all I/O activity, latching inputs on the rising edge with outputs on the falling edge, at any frequency from 0 to 50 MHz. |
| 7 | DNU | passive | Do not use; leave floating (not connected on the board) or tie to VDD. |
| 8 | VDD | power_in | Power supply input to the device (1.8 V to 3.6 V for CY15B102QN). |
## Key specifications
| Parameter | Value |
|---|---|
| Manufacturer | Cypress Semicon |
| Package | SOIC-8 |
| Category | Electronic Tools/Instruments/Consumables |
| Pins | 8 |
## Electrical characteristics
Limits as printed in the datasheet (page.json `metadata.characteristics` carries them as data).
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| Power supply voltage | VDD | 1.8 | 3.3 | 3.6 | V | CY15B102QN | 25 |
| Ambient temperature (Automotive-E) | TA | -40 | | 125 | °C | Operating range | 24 |
| Storage temperature | | -65 | | 150 | °C | | 23 |
| Maximum junction temperature | | | | 135 | °C | | 23 |
| Supply voltage on VDD relative to VSS | VDD | -0.5 | | 4.1 | V | CY15B102QN | 23 |
| Package power dissipation capability | | | | 1 | W | TA = 25°C | 23 |
| Surface mount lead soldering temperature | | | | 260 | °C | 3 seconds | 23 |
| DC output current | | | | 15 | mA | 1 output at a time, 1s duration | 23 |
| ESD voltage, Human Body Model | | | | 2 | kV | JESD22-A114-B | 23 |
| ESD voltage, Charged Device Model | | | | 500 | V | JESD22-C101-A | 23 |
| VDD supply current | IDD | | 0.5 | 1.4 | mA | VDD = 1.8 V to 3.6 V; fSCK = 1 MHz; SO = Open | 25 |
| VDD supply current | IDD | | 4.3 | 8 | mA | VDD = 1.8 V to 3.6 V; fSCK = 40 MHz; SO = Open | 25 |
| VDD supply current | IDD | | 6 | 8 | mA | VDD = 1.8 V to 3.6 V; fSCK = 50 MHz; SO = Open | 25 |
| VDD standby current | ISB | | 3.2 | | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 25°C | 25 |
| VDD standby current | ISB | | | 75 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 85°C | 25 |
| VDD standby current | ISB | | | 350 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 125°C | 25 |
| Deep power-down current | IDPD | | 1.3 | | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 25°C | 25 |
| Deep power-down current | IDPD | | | 17 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 85°C | 25 |
| Deep power-down current | IDPD | | | 80 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 125°C | 25 |
| Hibernate mode current | IHBN | | 0.1 | | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 25°C | 25 |
| Hibernate mode current | IHBN | | | 1.6 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 85°C | 25 |
| Hibernate mode current | IHBN | | | 14 | µA | VDD = 1.8 V to 3.6 V; CS = VDD; TA = 125°C | 25 |
| Input leakage current on I/O pins except WP pin | ILI | -5 | | 5 | µA | VSS < VIN < VDD | 25 |
| Input leakage current on WP pin | ILI | -100 | | 5 | µA | VSS < VIN < VDD | 25 |
| Output leakage current | ILO | -5 | | 5 | µA | VSS < VOUT < VDD | 26 |
| Input LOW voltage | VIL | -0.3 | | | V | max is 0.3 × VDD as printed | 26 |
| Output HIGH voltage | VOH1 | 2.4 | | | V | IOH = -1 mA, VDD = 2.7 V | 26 |
| Output LOW voltage | VOL1 | | | 0.4 | V | IOL = 2 mA, VDD = 2.7 V | 26 |
| Output LOW voltage | VOL2 | | | 0.2 | V | IOL = 150 µA | 26 |
| Data retention | TDR | 11000 | | | Hours | TA = 125°C | 27 |
| Data retention | TDR | 11 | | | Years | TA = 105°C | 27 |
| Data retention | TDR | 121 | | | Years | TA = 85°C | 27 |
| SCK clock frequency | fSCK | 0 | | 50 | MHz | 50 MHz column | 32 |
| Clock HIGH time | tCH | 9 | | | ns | 50 MHz column | 32 |
| Clock LOW time | tCL | 9 | | | ns | 50 MHz column | 32 |
| Chip select setup | tCSS | 5 | | | ns | 50 MHz column | 32 |
| Chip select hold - SPI mode 0 | tCSH | 5 | | | ns | 50 MHz column | 32 |
| Chip select hold - SPI mode 3 | tCSH1 | 10 | | | ns | 50 MHz column | 32 |
| Output disable time | tHZCS | | | 10 | ns | 50 MHz column | 32 |
| Output data valid time | tCO | | | 8 | ns | 50 MHz column | 32 |
| Output hold time | tOH | 1 | | | ns | 50 MHz column | 32 |
| Deselect time | tCS | 40 | | | ns | 50 MHz column | 32 |
| Data setup time | tSD | 5 | | | ns | 50 MHz column | 32 |
| Data hold time | tHD | 5 | | | ns | 50 MHz column | 32 |
| WP setup time (w.r.t CS) | tWPS | 20 | | | ns | 50 MHz column | 32 |
| WP hold time (w.r.t CS) | tWPH | 20 | | | ns | 50 MHz column | 32 |
| Power-up VDD(min) to first access (CS LOW) | tPU | 450 | | | µs | | 34 |
| VDD power-up ramp rate | tVR | 30 | | | µs/V | | 34 |
| VDD power-down ramp rate | tVF | 20 | | | µs/V | | 34 |
| CS HIGH to enter deep power-down | tENTDPD | | | 3 | µs | | 34 |
| Recovery time from deep power-down mode | tEXTDPD | | | 10 | µs | CS LOW to ready for access | 34 |
| CS HIGH to enter hibernate | tENTHIB | | | 3 | µs | | 34 |
| Recovery time from hibernate mode | tEXTHIB | | | 450 | µs | CS LOW to ready for access | 34 |
| Low VDD where initialization must occur | VDD(low) | 0.6 | | | V | | 34 |
## CAD (KiCad official)
- Symbol: `CY15B102QN-50SXE`
- Footprint: `Package_SO:SOIC-8_3.9x4.9mm_P1.27mm`
- 3D model: SOIC-8 (KiCad packages3D, STEP)
- 3D model files: `cy15b102qn-50sxe-etched.step` / `cy15b102qn-50sxe-etched.glb` carry the MPN laser-etched on the die in a toggleable `Adom.LaserEtch` group (Fusion-ready); `cy15b102qn-50sxe.step` / `cy15b102qn-50sxe.glb` are the bare package body.
## Provenance
Data extracted from the manufacturer datasheet, not a distributor listing:
- **Datasheet:** [Cypress Semicon datasheet](docs/cy15b102qn-50sxe-datasheet.pdf) (44 pp, sha256 `9412812a28df342f`, retrieved 2026-11-02, tier: lcsc)
- **Extractor:** parts-factory `2.0.0` / `extract_pins 0.3`, primary `claude-sonnet-5-5` (text), consensus `claude-opus-5-5` (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
- **CAD:** KiCad official libraries (CC-BY-SA 4.0).
[Datasheet PDF](docs/cy15b102qn-50sxe-datasheet.pdf)