AI Flow: Reverse Engineering

{
 "tests": [
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C1",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C1"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C2",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C2"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C3",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C3"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C4",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C4"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C5",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C5"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C6",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C6"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C7",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C7"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C8",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C8"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C9",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C9"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C10",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C10"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C11",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C11"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C12",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C12"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C13",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C13"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C14",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C14"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C15",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C15"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C16",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C16"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C17",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C17"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C18",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C18"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C19",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C19"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C20",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C20"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C21",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C21"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C22",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C22"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C23",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C23"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-Q1",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "Q1"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-Q2",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "Q2"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-Q3",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "Q3"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-Q4",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "Q4"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-Q5",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "Q5"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-Q6",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "Q6"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C24",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C24"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C25",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C25"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C26",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C26"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C27",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C27"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R4",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R4"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C28",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C28"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-JP1",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "JP1"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-U3",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "U3"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-U4",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "U4"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C29",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C29"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C30",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C30"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R9",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R9"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C31",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C31"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C32",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C32"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C33",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C33"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R11",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R11"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-U5",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "U5"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C34",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C34"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R13",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R13"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C35",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C35"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-U6",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "U6"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C36",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C36"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C37",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C37"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C38",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C38"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C39",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C39"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C40",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C40"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C41",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C41"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-U1",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "U1"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C42",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C42"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C43",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C43"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C44",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C44"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C45",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C45"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C46",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C46"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C47",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C47"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C48",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C48"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C49",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C49"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C50",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C50"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R19",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R19"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-LED1",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "LED1"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-LED2",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "LED2"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R20",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R20"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R21",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R21"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-D5",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "D5"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-D6",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "D6"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C51",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C51"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C52",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C52"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R24",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R24"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R25",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R25"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R26",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R26"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R27",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R27"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C53",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C53"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C54",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C54"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R30",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R30"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C55",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C55"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R31",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R31"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-R32",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "R32"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-C56",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "C56"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-H4",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "H4"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-H5",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "H5"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-H6",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "H6"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-H7",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "H7"
   ]
  },
  {
   "equipment": "lamp, loupe or microscope, DMM",
   "expected": "the marking or the measured value",
   "generated": true,
   "id": "T-H8",
   "ifNot": "update the part's value, MPN and footprint in parts.json and rebuild",
   "method": "Read the marking under raking light and magnification; if still unreadable, measure in circuit (resistance, diode test) or identify by pinout continuity",
   "settles": [
    "H8"
   ]
  },
  {
   "equipment": "DMM, microscope",
   "expected": "matches the file",
   "generated": true,
   "id": "T-block-sensing",
   "ifNot": "correct the item and rebuild",
   "method": "Inspect against the photos and measure on the board",
   "settles": [
    "block:sensing"
   ]
  },
  {
   "equipment": "DMM, microscope",
   "expected": "matches the file",
   "generated": true,
   "id": "T-block-logic-supply",
   "ifNot": "correct the item and rebuild",
   "method": "Inspect against the photos and measure on the board",
   "settles": [
    "block:logic-supply"
   ]
  },
  {
   "equipment": "DMM, microscope",
   "expected": "matches the file",
   "generated": true,
   "id": "T-block-gate-driver",
   "ifNot": "correct the item and rebuild",
   "method": "Inspect against the photos and measure on the board",
   "settles": [
    "block:gate-driver"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-bridge-X1",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:PHASE_X1"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-bridge-X3",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:PHASE_X3"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-bridge-X2",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:VIN"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-bridge-caps",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:VIN"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-drv-caps",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:VIN"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-logic",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:VIN"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-power-entry",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:VIN"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-vsense",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:VIN"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-can",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:GND"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-mcu-supply",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:GND"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-aux",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:+3V3"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-headers",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:+3V3"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-leds",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:+3V3"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-drv-csa",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:SOA"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-mcu-pinmap",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:SOA_ADC"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-ntc",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:NTC_ADC"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "every listed pin beeps to the others, and to no pin of another net",
   "generated": true,
   "id": "T-fan",
   "ifNot": "move the pin to the net that beeps, update nets.json and rebuild",
   "method": "Continuity from each pin of this net to the others, board unpowered",
   "settles": [
    "net:FAN_PWM_MCU"
   ]
  },
  {
   "equipment": "microscope or X-ray, DMM",
   "expected": "6 copper layers proposed; 4 is the minimum the inner-via candidates allow. A stackup of 4 means tighter routing than the 0.2 mm rule, or copper the router could not place outside the pours",
   "generated": false,
   "id": "T-layers",
   "ifNot": "re-propose the stackup and planes in layers.json",
   "method": "Count copper layers on the board edge under a microscope, or X-ray the board. Then ohm a stitching via in a pour to GND and to +3V3.",
   "settles": [
    "plane:In1.Cu"
   ]
  },
  {
   "equipment": "loupe or microscope, DMM in diode mode",
   "expected": "the orientation recorded in parts.json (pin1)",
   "generated": true,
   "id": "T-D1",
   "ifNot": "turn the part in parts.json and rebuild; check every net on its pins",
   "method": "Find pin 1 or the polarity: the cathode band or pin-1 mark under magnification, or a diode-mode reading across the part in circuit",
   "settles": [
    "D1"
   ]
  },
  {
   "equipment": "loupe or microscope, DMM in diode mode",
   "expected": "the orientation recorded in parts.json (pin1)",
   "generated": true,
   "id": "T-D2",
   "ifNot": "turn the part in parts.json and rebuild; check every net on its pins",
   "method": "Find pin 1 or the polarity: the cathode band or pin-1 mark under magnification, or a diode-mode reading across the part in circuit",
   "settles": [
    "D2"
   ]
  },
  {
   "equipment": "loupe or microscope, DMM in diode mode",
   "expected": "the orientation recorded in parts.json (pin1)",
   "generated": true,
   "id": "T-D3",
   "ifNot": "turn the part in parts.json and rebuild; check every net on its pins",
   "method": "Find pin 1 or the polarity: the cathode band or pin-1 mark under magnification, or a diode-mode reading across the part in circuit",
   "settles": [
    "D3"
   ]
  },
  {
   "equipment": "loupe or microscope, DMM in diode mode",
   "expected": "the orientation recorded in parts.json (pin1)",
   "generated": true,
   "id": "T-D4",
   "ifNot": "turn the part in parts.json and rebuild; check every net on its pins",
   "method": "Find pin 1 or the polarity: the cathode band or pin-1 mark under magnification, or a diode-mode reading across the part in circuit",
   "settles": [
    "D4"
   ]
  },
  {
   "equipment": "loupe or microscope, DMM in diode mode",
   "expected": "the orientation recorded in parts.json (pin1)",
   "generated": true,
   "id": "T-J1",
   "ifNot": "turn the part in parts.json and rebuild; check every net on its pins",
   "method": "Find pin 1 or the polarity: the cathode band or pin-1 mark under magnification, or a diode-mode reading across the part in circuit",
   "settles": [
    "J1"
   ]
  },
  {
   "equipment": "DMM in continuity mode, fine probes",
   "expected": "each pour reads continuous to its stated net and open to the other lugs",
   "generated": false,
   "id": "T-pour-nets",
   "ifNot": "correct the net in nets.json or the pin it disputes in detect/copper-measured.json, then trace and rebuild",
   "method": "With the board unpowered, continuity from each traced pour and track to the pins of its stated net, and to the screw lugs (VIN, GND, X1, X2, X3). For a pour of unknown net, ohm it to GND, VIN and each phase lug.",
   "settles": [
    "zone:isl-top-92"
   ]
  },
  {
   "equipment": "DMM, sharp probe",
   "expected": "continuity to the stated net",
   "generated": true,
   "id": "T-via-nets",
   "ifNot": "correct the via's net or kind in copper.json",
   "method": "Continuity from the via (probe its pad or scrape the tenting at its edge) to the pins of its net",
   "settles": [
    "via:v0"
   ]
  }
 ]
}