# AHW2012F-680KTF

**APV** · Inductors (SMD) · 0805

AHW2012F-680KTF from APV, in a 0805. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.

## Pinout

| Pin | Name | Type | Function |
|---|---|---|---|
| 1 | 1 | passive | Terminal 1 of an unpolarised inductor or ferrite bead; either orientation. |
| 2 | 2 | passive | Terminal 2 of an unpolarised inductor or ferrite bead; either orientation. |

## Key specifications

| Parameter | Value |
|---|---|
| Manufacturer | APV |
| Package | 0805 |
| Category | Inductors, Coils, Chokes |
| Pins | 2 |

## Electrical characteristics

Limits as printed in the datasheet (page.json `metadata.characteristics` carries them as data).

| Parameter | Symbol | Min | Typ | Max | Unit | Conditions | Page |
|---|---|---|---|---|---|---|---|
| Inductance | L |  | 68 |  | µH | Test freq. 2.5 MHz | 5 |
| Inductance tolerance (code K) |  | -10 |  | 10 | % | Tolerance code K = ±10% | 1 |
| Quality factor | Q | 8 |  |  | - | Test freq. 2.5 MHz | 5 |
| Self-resonant frequency | S.R.F | 11 |  |  | MHz |  | 5 |
| DC resistance | DCR |  |  | 17.5 | Ω |  | 5 |
| Heat rating current | Irms |  |  | 40 | mA |  | 5 |
| Operating temperature |  | -45 |  | 85 | ℃ | Including self heating | 1 |
| Inductance change after high temperature test | ΔL/L |  |  | 10 | % | Test temperature 85±3°C, 1000 hrs | 9 |
| Q change after high temperature test | ΔQ/Q |  |  | 30 | % | Test temperature 85±3°C, 1000 hrs | 9 |
| Inductance change after low temperature test | ΔL/L |  |  | 10 | % | Test temperature -25±3°C, 1000 hrs | 9 |
| Q change after low temperature test | ΔQ/Q |  |  | 30 | % | Test temperature -25±3°C, 1000 hrs | 9 |
| Inductance change after damp heat test | ΔL/L |  |  | 10 | % | Test temperature 40±2°C, humidity 90-95% RH, 1000 hrs | 9 |
| Q change after damp heat test | ΔQ/Q |  |  | 30 | % | Test temperature 40±2°C, humidity 90-95% RH, 1000 hrs | 9 |
| Inductance change after thermal shock test | ΔL/L |  |  | 10 | % | 100 cycles of -25±3°C / 85±3°C | 9 |
| Q change after thermal shock test | ΔQ/Q |  |  | 30 | % | 100 cycles of -25±3°C / 85±3°C | 9 |
| Inductance change after load life test | ΔL/L |  |  | 10 | % | Test temperature 85±3°C, 1000 hrs, rated current applied | 9 |
| Q change after load life test | ΔQ/Q |  |  | 30 | % | Test temperature 85±3°C, 1000 hrs, rated current applied | 9 |
| Inductance change after vibration test | ΔL/L |  |  | 10 | % | Frequency 10→55→10 Hz, amplitude 1.5 mm, 6 h total | 9 |
| Q change after vibration test | ΔQ/Q |  |  | 30 | % | Frequency 10→55→10 Hz, amplitude 1.5 mm, 6 h total | 9 |
| Inductance change after resistance to soldering heat test | ΔL/L |  |  | 10 | % | Preheat 150°C 1 min; solder 260±5°C, 10±2 s | 9 |
| Q change after resistance to soldering heat test | ΔQ/Q |  |  | 30 | % | Preheat 150°C 1 min; solder 260±5°C, 10±2 s | 9 |

## CAD (KiCad official)

- Symbol: `AHW2012F-680KTF`
- Footprint: `Inductor_SMD:L_0805_2012Metric`
- 3D model: 0805 (KiCad packages3D, STEP)
- 3D model files: `ahw2012f-680ktf-etched.step` / `ahw2012f-680ktf-etched.glb` carry the MPN laser-etched on the die in a toggleable `Adom.LaserEtch` group (Fusion-ready); `ahw2012f-680ktf.step` / `ahw2012f-680ktf.glb` are the bare package body.

## Provenance

Data extracted from the manufacturer datasheet, not a distributor listing:

- **Datasheet:** [APV datasheet](https://jlcpcb.com/api/file/downloadByFileSystemAccessId/8772566704583266304) (14 pp, sha256 `9b290c78444cf7df`, retrieved 2026-10-17, tier: lcsc)
- **Extractor:** parts-factory `2.0.0` / `extract_pins`, primary `two-terminal convention` (convention), consensus `off` (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
- **CAD:** KiCad official libraries (CC-BY-SA 4.0).

[Datasheet PDF](docs/ahw2012f-680ktf-datasheet.pdf)