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Contents

README

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7E32000E09UCG

SJK(SHENZHEN CRYSTAL TECH) · Crystals · SMD2520-4P

7E32000E09UCG from SJK(SHENZHEN CRYSTAL TECH), in a SMD2520-4P. Pinout and pin descriptions extracted from the manufacturer datasheet (extract_pins, cross-checked by a second model); symbol, footprint, and 3D from KiCad-official CAD.

Pinout

Pin Name Type Function
1 XTAL1 passive Crystal terminal 1 of the 32.000 MHz AT-cut fundamental crystal, 9.0 pF load capacitance, diagonal to pin 3.
2 GND power_in Ground pin, marked GND in the top-view crystal connection drawing (connected to the lid/case).
3 XTAL2 passive Crystal terminal 2 of the 32.000 MHz AT-cut fundamental crystal, 9.0 pF load capacitance, diagonal to pin 1.
4 GND power_in Ground pin, marked GND in the top-view crystal connection drawing (connected to the lid/case).

Key specifications

Parameter Value
Manufacturer SJK(SHENZHEN CRYSTAL TECH)
Package SMD2520-4P
Category Crystal Oscillator/Oscillator/Resonator
Pins 4

Electrical characteristics

Limits as printed in the datasheet (page.json metadata.characteristics carries them as data).

Parameter Symbol Min Typ Max Unit Conditions Page
Frequency tolerance -10 10 ppm at 25°C 2
Frequency stability over operating temperature -10 10 ppm -20 °C to +70 °C 2
Frequency stability over operating temperature -30 30 ppm -40 °C to +85 °C 2
Aging -3 3 ppm/year @25°C 1st year (Max) 2
Shunt capacitance C0 3 pF Max 2
Equivalent series resistance ESR 50 Ω Max 2
Operating temperature range -40 85 °C 2
Storage temperature range -40 125 °C 2
Frequency change after drop test -5 5 ppm Drop from 55 cm onto board, 3 times 4
Resistance (ESR) change after drop test -15 15 % Drop from 55 cm onto board, 3 times 4
Frequency change after vibration test -5 5 ppm 10~55 Hz, 1.5 mm amplitude, 2 h per axis 4
Resistance (ESR) change after vibration test -15 15 % 10~55 Hz, 1.5 mm amplitude, 2 h per axis 4
Frequency change after thermal shock test -5 5 ppm -40 °C to 85 °C, 25 cycles 4
Resistance (ESR) change after thermal shock test -15 15 % -40 °C to 85 °C, 25 cycles 4
Frequency change after reflow (solder heat resistance) test -5 5 ppm Wave peak 260 °C ±10 °C, 15 ±5 s 4
Resistance (ESR) change after reflow (solder heat resistance) test -15 15 % Wave peak 260 °C ±10 °C, 15 ±5 s 4
Frequency change after high temperature high humidity test -5 5 ppm 60 °C ±2 °C, 90%~95% RH, 240 h 4
Resistance (ESR) change after high temperature high humidity test -15 15 % 60 °C ±2 °C, 90%~95% RH, 240 h 4
Frequency change after high temperature test -5 5 ppm 85 °C ±2 °C, 240 h 4
Resistance (ESR) change after high temperature test -15 15 % 85 °C ±2 °C, 240 h 4
Frequency change after low temperature test -5 5 ppm -40 °C ±2 °C, 240 h 4
Resistance (ESR) change after low temperature test -15 15 % -40 °C ±2 °C, 240 h 4
Nominal frequency 32 MHz Output frequency range, AT fundamental 2
Load capacitance CL 9 pF 2
Driver level 10 µW Typical 2

CAD (KiCad official)

  • Symbol: 7E32000E09UCG
  • Footprint: Crystal:Crystal_SMD_2520-4Pin_2.5x2.0mm
  • 3D model: SMD2520-4P (KiCad packages3D, STEP)
  • 3D model files: 7e32000e09ucg-etched.step / 7e32000e09ucg-etched.glb carry the MPN laser-etched on the die in a toggleable Adom.LaserEtch group (Fusion-ready); 7e32000e09ucg.step / 7e32000e09ucg.glb are the bare package body.

Provenance

Data extracted from the manufacturer datasheet, not a distributor listing:

  • Datasheet: SJK(SHENZHEN CRYSTAL TECH) datasheet (4 pp, sha256 539e8fbd53ed60a8, retrieved 2026-10-22, tier: lcsc)
  • Datasheet language: Chinese. Pin names, descriptions, and specs on this page were extracted and translated to English by ds2sf; the linked PDF is the manufacturer original.
  • Extractor: parts-factory 2.0.0 / extract_pins 0.3, primary claude-sonnet-5-5 (text+vision), consensus claude-opus-5-5 (agreed), guards: pin_guards 0.1: passed. Pins are checked against the footprint pad set and their cited datasheet pages before publish.
  • CAD: KiCad official libraries (CC-BY-SA 4.0).

Datasheet PDF